Inventor · disambiguated record
Junichi Tashiro
Also filed as: TASHIRO JUNICHI
31 granted patents·10 pending applications·114 citations·filing 2002–2025
95Inventor score
Files withOLYMPUS CORP7SII NANOTECHNOLOGY INC6OLYMPUS MEDICAL SYSTEMS CORP3TOSHIBA MEDICAL SYS CORP3CANON MEDICAL SYSTEMS CORP2
Top patents by PatentIndex Score
41 records- 0187US7827148B2Medical equipment having audit log managing functionTOSHIBA KK·Filed 2006·Granted Nov 2, 2010·35 cites·22 claims
- 0285US9030544B2Wireless video transmission system and transmission deviceOLYMPUS MEDICAL SYSTEMS CORP·Filed 2013·Granted May 12, 2015·9 cites·6 claims
- 0385US8957952B2Color signal transmission device, wireless image transmission system, and transmitterOLYMPUS MEDICAL SYSTEMS CORP·Filed 2013·Granted Feb 17, 2015·7 cites·8 claims
- 0483US8198603B2Sample preparing device and sample posture shifting methodTAKAHASHI HARUO·Filed 2008·Granted Jun 12, 2012·9 cites·20 claims
- 0581US8274049B2Sample processing and observing methodTANAKA KEIICHI·Filed 2011·Granted Sep 25, 2012·5 cites·7 claims
- 0681US7423266B2Sample height regulating method, sample observing method, sample processing method and charged particle beam apparatusSII NANOTECHNOLOGY INC·Filed 2006·Granted Sep 9, 2008·7 cites·20 claims
- 0776US8274063B2Composite focused ion beam device, process observation method using the same, and processing methodKAITO TAKASHI·Filed 2008·Granted Sep 25, 2012·4 cites·20 claims
- 0875US7531796B2Focused ion beam apparatus and sample section forming and thin-piece sample preparing methodsSII NANOTECHNOLOGY INC·Filed 2007·Granted May 12, 2009·3 cites·6 claims
- 0973US8664598B2Electron microscope and specimen analyzing methodHASUDA MASAKATSU·Filed 2011·Granted Mar 4, 2014·4 cites·16 claims
- 1073US8542275B2Method and apparatus for cross-section processing and observationKIYOHARA MASAHIRO·Filed 2010·Granted Sep 24, 2013·2 cites·7 claims
- 1172US7172839B2Photomask correction method using composite charged particle beam, and device used in the correction methodSII NANOTECHNOLOGY INC·Filed 2003·Granted Feb 6, 2007·10 cites·6 claims
- 1271US8269194B2Composite focused ion beam device, and processing observation method and processing method using the sameKAITO TAKASHI·Filed 2008·Granted Sep 18, 2012·3 cites·19 claims
- 1371US7755044B2Apparatus for working and observing samples and method of working and observing cross sectionsSII NANOTECHNOLOGY INC·Filed 2008·Granted Jul 13, 2010·2 cites·11 claims
- 1470US8426830B2Focused ion beam apparatus, sample processing method using the same, and computer program for focused ion beam processingSATO MAKOTO·Filed 2009·Granted Apr 23, 2013·2 cites·7 claims
- 1569US9396534B2Medical image processing apparatus and medical image processing systemTOSHIBA MEDICAL SYS CORP·Filed 2015·Granted Jul 19, 2016·2 cites·18 claims
- 1669US7595488B2Method and apparatus for specifying working position on a sample and method of working the sampleSII NANOTECHNOLOGY INC·Filed 2005·Granted Sep 29, 2009·2 cites·20 claims
- 1764US9584795B2Wireless transfer systemOLYMPUS CORP·Filed 2016·Granted Feb 28, 2017·1 cites·13 claims
- 1861US8306264B2Section processing method and its apparatusFUJII TOSHIAKI·Filed 2009·Granted Nov 6, 2012·3 cites·7 claims
- 1959US10268802B2Medical image processing apparatus and medical image processing systemTOSHIBA MEDICAL SYS CORP·Filed 2015·Granted Apr 23, 2019·1 cites·17 claims
- 2056US2025299820A1Medical information processing apparatus, medical information processing method, and storage mediumCANON MEDICAL SYSTEMS CORP·Filed 2025·Application pending·0 cites
- 2155US2013275147A1Medical information interoperability testing apparatusTOSHIBA MEDICAL SYS CORP·Filed 2013·Application pending·0 cites
- 2253US7872231B2Sample relocation method in charged particle beam apparatus and charged particle beam apparatus as well as sample for transmission electron microscopeSLL NANOTECHNOLOGY INC·Filed 2008·Granted Jan 18, 2011·1 cites·13 claims
- 2352US2024242341A1Image analysis support apparatus, image analysis support system, and image analysis support methodCANON MEDICAL SYSTEMS CORP·Filed 2024·Application pending·0 cites
- 2452US2009134327A1Defect recognizing method, defect observing method, and charged particle beam apparatusIKKU YUTAKA·Filed 2008·Application pending·0 cites
- 2551US10561299B2Medical information recording deviceOLYMPUS CORP·Filed 2018·Granted Feb 18, 2020·0 cites·14 claims
- 2651US8657962B2Particle removing method, particle removing device, atomic force microscope, and charged particle beam apparatusHAYASHI HIROKI·Filed 2008·Granted Feb 25, 2014·1 cites·11 claims
- 2751US2007267579A1Photomask correction method using composite charged particle beam, and device used in the correction methodSUGIYAMA YASUHIKO·Filed 2006·Application pending·0 cites
- 2850US12003891B2Image recording apparatus, image recording method, and endoscope systemOLYMPUS CORP·Filed 2021·Granted Jun 4, 2024·0 cites·10 claims
- 2948US10951800B2Endoscope system and endoscope processorOLYMPUS CORP·Filed 2020·Granted Mar 16, 2021·0 cites·9 claims
- 3048US2011320595A1Medical information processing device and software distributing systemKONISHI HAYATO·Filed 2011·Application pending·0 cites
- 3147US7678405B2Oil-in-water type emulsion comprising vegetable sterolsAJINOMOTO KK·Filed 2002·Granted Mar 16, 2010·1 cites·21 claims
- 3245US10728470B2Image processing device, image processing method, and non-transitory computer readable medium storing image processing programOLYMPUS CORP·Filed 2018·Granted Jul 28, 2020·0 cites·15 claims
- 3345US2015145979A1Radio communication system and communication methodOLYMPUS MEDICAL SYSTEMS CORP·Filed 2014·Application pending·0 cites
- 3443US10993608B2Endoscope system and control methodOLYMPUS CORP·Filed 2020·Granted May 4, 2021·0 cites·12 claims
- 3543US7923267B2Method of measuring length of measurement object article in micro-structureSII NANOTECHNOLOGY INC·Filed 2006·Granted Apr 12, 2011·0 cites·14 claims
- 3642US2008131792A1Method of Correcting Photomask DefectTAKAOKA OSAMU·Filed 2007·Application pending·0 cites
- 3741US2008107975A1Method of Correcting Photomask DefectTAKAOKA OSAMU·Filed 2007·Application pending·0 cites
- 3840US2011052044A1Method and apparatus for cross-section processing and observationTAKAHASHI HARUO·Filed 2010·Application pending·0 cites
- 3937US9661081B2Wireless image transfer system and wireless image transfer methodOLYMPUS CORP·Filed 2016·Granted May 23, 2017·0 cites·8 claims
- 4036US8581206B2Focused ion beam system and sample processing method using the sameMAN XIN·Filed 2010·Granted Nov 12, 2013·0 cites·4 claims
- 4129US8176356B2Medical-information communication-connection management device and a method of managing a medical-information communication connectionTASHIRO JUNICHI·Filed 2010·Granted May 8, 2012·0 cites·10 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →