Inventor · disambiguated record
David Y. Wang
Also filed as: WANG DAVID · WANG DAVID Y
57 granted patents·5 pending applications·1,084 citations·filing 1992–2024
99Inventor score
Top patents by PatentIndex Score
62 records- 0197US11309202B2Overlay metrology on bonded wafersKLA CORP·Filed 2020·Granted Apr 19, 2022·5 cites·39 claims
- 0296US9310290B2Multiple angles of incidence semiconductor metrology systems and methodsKLA TENCOR CORP·Filed 2015·Granted Apr 12, 2016·18 cites·35 claims
- 0396US9228943B2Dynamically adjustable semiconductor metrology systemKLA TENCOR CORP·Filed 2012·Granted Jan 5, 2016·31 cites·41 claims
- 0496US8860937B1Metrology systems and methods for high aspect ratio and large lateral dimension structuresKLA TENCOR CORP·Filed 2013·Granted Oct 14, 2014·35 cites·19 claims
- 0596US6597212B1Divide-by-N differential phase interpolatorNEOAXIOM CORP·Filed 2002·Granted Jul 22, 2003·94 cites·16 claims
- 0695US9921104B2Simultaneous multi-angle spectroscopyKLA TENCOR CORP·Filed 2016·Granted Mar 20, 2018·9 cites·21 claims
- 0795US5583825AMethod for deriving reservoir lithology and fluid content from pre-stack inversion of seismic dataEXXON PRODUCTION RESEARCH CO·Filed 1994·Granted Dec 10, 1996·286 cites·35 claims
- 0894US6266799B1Multi-phase data/clock recovery circuitry and methods for implementing sameXAQTI CORP·Filed 1997·Granted Jul 24, 2001·136 cites·8 claims
- 0993US11906770B2Monolithic optical retarderKLA CORP·Filed 2021·Granted Feb 20, 2024·2 cites·38 claims
- 1093US8896832B2Discrete polarization scatterometryHILL ANDREW V·Filed 2011·Granted Nov 25, 2014·25 cites·35 claims
- 1193US7304735B2Broadband wavelength selective filterKLA TENCOR TECHNOLOGIES·Filed 2005·Granted Dec 4, 2007·29 cites·24 claims
- 1292US9921152B2Systems and methods for extended infrared spectroscopic ellipsometryKLA TENCOR CORP·Filed 2016·Granted Mar 20, 2018·5 cites·22 claims
- 1390US11137350B2Mid-infrared spectroscopy for measurement of high aspect ratio structuresKLA CORP·Filed 2020·Granted Oct 5, 2021·2 cites·37 claims
- 1490US10801953B2Semiconductor metrology based on hyperspectral imagingKLA TENCOR CORP·Filed 2019·Granted Oct 13, 2020·7 cites·23 claims
- 1590US7061614B2Measurement system with separate optimized beam pathsTHERMA WAVE INC·Filed 2002·Granted Jun 13, 2006·43 cites·24 claims
- 1690US6744505B1Compact imaging spectrometerTHERMA WAVE INC·Filed 2002·Granted Jun 1, 2004·46 cites·17 claims
- 1788US9400246B2Optical metrology tool equipped with modulated illumination sourcesKLA TENCOR CORP·Filed 2012·Granted Jul 26, 2016·5 cites·24 claims
- 1888US9116103B2Multiple angles of incidence semiconductor metrology systems and methodsKLA TENCOR CORP·Filed 2013·Granted Aug 25, 2015·7 cites·34 claims
- 1988US6429734B1Differential active loop filter for phase locked loop circuitsNEOAXIOM CORP·Filed 2001·Granted Aug 6, 2002·36 cites·14 claims
- 2087US10215693B2Infrared spectroscopic reflectometer for measurement of high aspect ratio structuresKLA TENCOR CORP·Filed 2016·Granted Feb 26, 2019·4 cites·28 claims
- 2184US6587282B1Broadband refractive objective for small spot optical metrologyTHERMA WAVE INC·Filed 2002·Granted Jul 1, 2003·24 cites·9 claims
- 2283US10690602B2Methods and systems for measurement of thick films and high aspect ratio structuresKLA TENCOR CORP·Filed 2018·Granted Jun 23, 2020·3 cites·22 claims
- 2382US7020227B1Method and apparatus for high-speed clock data recovery using low-speed circuitsACARD TECHNOLOGY CORP·Filed 2002·Granted Mar 28, 2006·39 cites·1 claims
- 2482USD377789STouch padPRIMAX ELECTRONICS LTD·Filed 1995·Granted Feb 4, 1997·26 cites·1 claims
- 2580US11231362B1Multi-environment polarized infrared reflectometer for semiconductor metrologyKLA CORP·Filed 2019·Granted Jan 25, 2022·1 cites·20 claims
- 2680US8643841B1Angle-resolved spectroscopic instrumentROTTER LAWRENCE D·Filed 2011·Granted Feb 4, 2014·4 cites·20 claims
- 2780USD380207SHandy track pointerPRIMAX ELECTRONICS LTD·Filed 1995·Granted Jun 24, 1997·23 cites·1 claims
- 2876US11043239B2Magneto-optic Kerr effect metrology systemsKLA CORP·Filed 2020·Granted Jun 22, 2021·1 cites·10 claims
- 2975US7050162B2Optical metrology tool having improved contrastTHERMA WAVE INC·Filed 2002·Granted May 23, 2006·12 cites·28 claims
- 3073US11913874B2Optical metrology tool equipped with modulated illumination sourcesKLA CORP·Filed 2021·Granted Feb 27, 2024·0 cites·12 claims
- 3173US7251036B2Beam splitter/combiner for optical metrology toolTHERMA WAVE INC·Filed 2006·Granted Jul 31, 2007·4 cites·16 claims
- 3273US7227637B2Measurement system with separate optimized beam pathsTHERMA WAVE INC·Filed 2006·Granted Jun 5, 2007·6 cites·21 claims
- 3369US6784991B2Diffractive optical elements and grid polarizers in focusing spectroscopic ellipsometersTHERMA WAVE INC·Filed 2002·Granted Aug 31, 2004·8 cites·12 claims
- 3468US12449352B2Optics for measurement of thick films and high aspect ratio structuresKLA CORP·Filed 2023·Granted Oct 21, 2025·0 cites·20 claims
- 3567US6765444B2Cross clocked lock detector circuit for phase locked loopNEOAXIOM CORP·Filed 2002·Granted Jul 20, 2004·15 cites·11 claims
- 3666US10234763B2Method of providing photopatterned functional surfacesEASTMAN KODAK CO·Filed 2017·Granted Mar 19, 2019·1 cites·13 claims
- 3766US9146156B2Light source tracking in optical metrology systemZHUANG GUORONG V·Filed 2011·Granted Sep 29, 2015·3 cites·21 claims
- 3866US7206125B2Infrared blocking filter for broadband Optical metrologyTHERMA WAVE INC·Filed 2004·Granted Apr 17, 2007·9 cites·28 claims
- 3965US9519093B2Broadband and wide field angle compensatorKLA TENCOR CORP·Filed 2014·Granted Dec 13, 2016·1 cites·20 claims
- 4065US7027158B2Beam splitter/combiner for optical meterology toolTHERMA WAVE INC·Filed 2002·Granted Apr 11, 2006·6 cites·27 claims
- 4164US12461041B2Measurement of thick films and high aspect ratio structuresKLA CORP·Filed 2023·Granted Nov 4, 2025·0 cites·20 claims
- 4264US10215688B2Optical metrology tool equipped with modulated illumination sourcesKLA TENCOR CORP·Filed 2016·Granted Feb 26, 2019·0 cites·19 claims
- 4363US10969328B2Optical metrology tool equipped with modulated illumination sourcesKLA TENCOR CORP·Filed 2019·Granted Apr 6, 2021·0 cites·10 claims
- 4463US6531905B1Flip-flop with metastability reductionNEOAXIOM CORP·Filed 2001·Granted Mar 11, 2003·10 cites·8 claims
- 4562US11119050B2Methods and systems for measurement of thick films and high aspect ratio structuresKLA CORP·Filed 2020·Granted Sep 14, 2021·0 cites·20 claims
- 4662US7190460B2Focusing optics for small spot optical metrologyTHERMA WAVE INC·Filed 2003·Granted Mar 13, 2007·7 cites·4 claims
- 4762USD342492SOptical scannerUMAX DATA SYSTEM INC·Filed 1992·Granted Dec 21, 1993·10 cites·1 claims
- 4861US9740309B2Finger-driven computer mouseWANG DAVID Y·Filed 2015·Granted Aug 22, 2017·1 cites·5 claims
- 4961US7154607B2Flat spectrum illumination source for optical metrologyTHERMA WAVE INC·Filed 2003·Granted Dec 26, 2006·8 cites·14 claims
- 5061US6879449B2Broadband refractive objective for small spot optical metrologyTHERMA WAVE INC·Filed 2003·Granted Apr 12, 2005·6 cites·5 claims
Showing the top 50 of 62 patent records by PatentIndex Score.
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