Inventor · disambiguated record
Teunis Willem Tukker
Also filed as: TUKKER TEUNIS W · TUKKER TEUNIS WILLEM
32 granted patents·35 pending applications·148 citations·filing 2001–2024
96Inventor score
Files withKONINKL PHILIPS ELECTRONICS NV34ASML NETHERLANDS BV14TUKKER TEUNIS WILLEM6CP MAHK JAPAN CO LTD2KONINKL PHILIPS NV2
Top patents by PatentIndex Score
67 records- 0192US7907345B2Collimating module and device for zero overfill illumination applications with beam width controlKONINKL PHILIPS ELECTRONICS NV·Filed 2008·Granted Mar 15, 2011·34 cites·5 claims
- 0288US9169997B2Arrangement for spot illuminationKURT RALPH·Filed 2011·Granted Oct 27, 2015·17 cites·17 claims
- 0386US9480116B2Dimmer control of angular distribution of lightVISSENBERG MICHEL CORNELIS JOSEPHUS MARIE·Filed 2012·Granted Oct 25, 2016·8 cites·15 claims
- 0485US6806959B2Measurement of surface defects on a movable surfaceKONINKL PHILIPS ELECTRONICS NV·Filed 2001·Granted Oct 19, 2004·26 cites·13 claims
- 0582US10534274B2Method of inspecting a substrate, metrology apparatus, and lithographic systemASML NETHERLANDS BV·Filed 2017·Granted Jan 14, 2020·2 cites·18 claims
- 0682US10437159B2Measurement system, lithographic system, and method of measuring a targetASML NETHERLANDS BV·Filed 2017·Granted Oct 8, 2019·2 cites·20 claims
- 0781US10725381B2Optical systems, metrology apparatus and associated methodASML NETHERLANDS BV·Filed 2018·Granted Jul 28, 2020·3 cites·15 claims
- 0879US10303064B2Radiation conditioning system, illumination system and metrology apparatus, device manufacturing methodASML NETHERLANDS BV·Filed 2017·Granted May 28, 2019·2 cites·20 claims
- 0979US8529103B2Illumination system for spot illuminationTUKKER TEUNIS WILLEM·Filed 2010·Granted Sep 10, 2013·8 cites·12 claims
- 1078US10234767B2Device and method for processing a radiation beam with coherenceASML NETHERLANDS BV·Filed 2017·Granted Mar 19, 2019·1 cites·19 claims
- 1178US9766385B2Illumination device with waveguide and LEDsBOONEKAMP ERIK PAUL·Filed 2011·Granted Sep 19, 2017·5 cites·19 claims
- 1278US2024404036A1Detection apparatus for simultaneous acquisition of multiple diverse images of an objectASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 1376US10180630B2Illumination system for a lithographic or inspection apparatusASML NETHERLANDS BV·Filed 2017·Granted Jan 15, 2019·2 cites·20 claims
- 1475US10852247B2Variable corrector of a wave frontASML HOLDING NV·Filed 2017·Granted Dec 1, 2020·2 cites·23 claims
- 1575US9377179B2Color correcting optical elementKONINKL PHILIPS NV·Filed 2013·Granted Jun 28, 2016·5 cites·11 claims
- 1673US8915612B2Illumination system for spot illumination with reduced symmetryKURT RALPH·Filed 2010·Granted Dec 23, 2014·4 cites·14 claims
- 1772US7701832B2Optical record carrier scanning deviceCP MAHK JAPAN CO LTD·Filed 2005·Granted Apr 20, 2010·3 cites·29 claims
- 1867US7170832B2Optical scanning deviceKONINKL PHILIPS ELECTRONICS NV·Filed 2003·Granted Jan 30, 2007·10 cites·7 claims
- 1963US12086973B2Detection apparatus for simultaneous acquisition of multiple diverse images of an objectASML NETHERLANDS BV·Filed 2020·Granted Sep 10, 2024·0 cites·14 claims
- 2061US7130258B2Field curvature reduction for optical systemKONINKL PHILIPS ELECTRONICS NV·Filed 2002·Granted Oct 31, 2006·4 cites·19 claims
- 2160US7994530B2Light emitting diode moduleKONINKL PHILIPS ELECTRONICS NV·Filed 2007·Granted Aug 9, 2011·1 cites·7 claims
- 2258US2025370354A1Sensor module, illuminator, metrology device and associated metrology methodASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 2358US2024345489A1Metrology method and metrology deviceASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 2456US7310189B2Variable beam shaping elementKONINKL PHILIPS ELECTRONICS NV·Filed 2004·Granted Dec 18, 2007·2 cites·12 claims
- 2555US10495889B2Beam homogenizer, illumination system and metrology systemASML NETHERLANDS BV·Filed 2017·Granted Dec 3, 2019·0 cites·21 claims
- 2654US7034974B2Optical scanning device including a tilt tolerant objective systemKONINKL PHILIPS ELECTRONICS NV·Filed 2003·Granted Apr 25, 2006·2 cites·11 claims
- 2752US2025138436A1Metrology method and deviceASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 2851US2025044715A1Projection unit for a level sensor, method of monitoring height of a substrate, and lithographic system comprising the projection unitASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 2950US8337044B2Elongated luminaire comprising LEDs for illuminating objects in front of the luminaireTUKKER TEUNIS WILLEM·Filed 2008·Granted Dec 25, 2012·0 cites·5 claims
- 3050US7706234B2Optical head with switchable diameter of the radiation spot on the radiation detectorKONINKL PHILIPS ELECTRONICS NV·Filed 2005·Granted Apr 27, 2010·0 cites·32 claims
- 3150US7161891B2Optical scanning deviceKONINKL PHILIPS ELECTRONICS NV·Filed 2003·Granted Jan 9, 2007·1 cites·13 claims
- 3250US6906803B2Inspection of surfacesKONINKL PHILIPS ELECTRONICS NV·Filed 2001·Granted Jun 14, 2005·2 cites·7 claims
- 3348US7602691B2Diffractive partKONINKL PHILIPS ELECTRONICS NV·Filed 2005·Granted Oct 13, 2009·0 cites·13 claims
- 3448US2008192600A1Spherical Aberration DetectorKONINKL PHILIPS ELECTRONICS NV·Filed 2006·Application pending·0 cites
- 3548US2008239926A1Optical Compensator, Optical Element, Optical Scanning Head An Optical Scanning DeviceKONINKL PHILIPS ELECTRONICS NV·Filed 2006·Application pending·0 cites
- 3647US7453564B2Method of determining a property of a fluid and spectroscopic systemKONINKL PHILIPS ELECTRONICS NV·Filed 2004·Granted Nov 18, 2008·1 cites·18 claims
- 3747US2008205242A1Multi-Radiation Beam Optical Scanning DeviceKONINKL PHILIPS ELECTRONICS NV·Filed 2006·Application pending·0 cites
- 3847US2009296559A1Optical scanning deviceKONINKL PHILIPS ELECTRONICS NV·Filed 2005·Application pending·0 cites
- 3947US2008205247A1Multi-Radiation Beam Optical Scanning DeviceKONINKL PHILIPS ELECTRONICS NV·Filed 2006·Application pending·0 cites
- 4046US2009225642A1Switchable optical elementKONINKL PHILIPS ELECTRONICS NV·Filed 2005·Application pending·0 cites
- 4146US2008159112A1Spot Size Focus Error Detection For Multiple Beam Optical Scanning DeviceKONINKL PHILIPS ELECTRONICS NV·Filed 2006·Application pending·0 cites
- 4246US2008117786A1Optical Scanning DeviceKONINKL PHILIPS ELECTRONICS NV·Filed 2006·Application pending·0 cites
- 4346US2008298404A1Radiation Beam Source DeviceKONINKL PHILIPS ELECTRONICS NV·Filed 2005·Application pending·0 cites
- 4446US2008186831A1Optical Scanning DeviceKONINKL PHILIPS ELECTRONICS NV·Filed 2006·Application pending·0 cites
- 4546US2010046347A1Optical scanning deviceKONINKL PHILIPS ELECTRONICS NV·Filed 2006·Application pending·0 cites
- 4646US2008062852A1Multi-Dimensional Optical ScannerKONINKL PHILIPS ELECTRONICS NV·Filed 2005·Application pending·0 cites
- 4746US2009279409A1Optimal detection of twodos signalsKONINKL PHILIPS ELECTRONICS NV·Filed 2005·Application pending·0 cites
- 4845US7359294B2Optical scanning device with tilt detectionKONINKL PHILIPS ELECTRONICS NV·Filed 2003·Granted Apr 15, 2008·1 cites·13 claims
- 4945US2008019237A1Focus control in a multiple-beam disc driveKONINKL PHILIPS ELECTRONICS NV·Filed 2005·Application pending·0 cites
- 5044US7939996B2Display device with solid state fluorescent materialKONINKL PHILIPS ELECTRONICS NV·Filed 2006·Granted May 10, 2011·0 cites·11 claims
Showing the top 50 of 67 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →