Inventor · disambiguated record
Maryjane Brodsky
Also filed as: BRODSKY MARYJANE
13 granted patents·2 pending applications·127 citations·filing 2005–2013
91Inventor score
Top patents by PatentIndex Score
15 records- 0195US7671394B2Embedded trench capacitor having a high-k node dielectric and a metallic inner electrodeIBM·Filed 2007·Granted Mar 2, 2010·30 cites·20 claims
- 0292US7759766B2Electrical fuse having a thin fuselinkIBM·Filed 2007·Granted Jul 20, 2010·24 cites·20 claims
- 0391US7888723B2Deep trench capacitor in a SOI substrate having a laterally protruding buried strapIBM·Filed 2008·Granted Feb 15, 2011·17 cites·25 claims
- 0491US7310585B2Method of inspecting integrated circuits during fabricationIBM·Filed 2005·Granted Dec 18, 2007·17 cites·26 claims
- 0590US7875919B2Shallow trench capacitor compatible with high-K / metal gateIBM·Filed 2008·Granted Jan 25, 2011·18 cites·7 claims
- 0686US8952460B2Germanium oxide free atomic layer deposition of silicon oxide and high-k gate dielectric on germanium containing channel for CMOS devicesIBM·Filed 2013·Granted Feb 10, 2015·7 cites·7 claims
- 0774US9029959B2Composite high-k gate dielectric stack for reducing gate leakageBRODSKY MARYJANE·Filed 2012·Granted May 12, 2015·3 cites·12 claims
- 0871US9040399B2Threshold voltage adjustment for thin body MOSFETsBRODSKY MARYJANE·Filed 2011·Granted May 26, 2015·3 cites·5 claims
- 0968US7397556B2Method, apparatus, and computer program product for optimizing inspection recipes using programmed defectsIBM·Filed 2006·Granted Jul 8, 2008·2 cites·6 claims
- 1067US8809152B2Germanium oxide free atomic layer deposition of silicon oxide and high-k gate dielectric on germanium containing channel for CMOS devicesBRODSKY MARYJANE·Filed 2011·Granted Aug 19, 2014·2 cites·26 claims
- 1167US8198169B2Deep trench capacitor in a SOI substrate having a laterally protruding buried strapBRODSKY MARYJANE·Filed 2010·Granted Jun 12, 2012·2 cites·12 claims
- 1266US9059315B2Concurrently forming nFET and pFET gate dielectric layersIBM·Filed 2013·Granted Jun 16, 2015·2 cites·20 claims
- 1355US2008225284A1Method, apparatus, and computer program product for optimizing inspection recipes using programmed defectsIBM·Filed 2008·Application pending·0 cites
- 1452US7454302B2Method of inspecting integrated circuits during fabricationIBM·Filed 2007·Granted Nov 18, 2008·0 cites·13 claims
- 1545US2013105896A1Threshold Voltage Adjustment For Thin Body MosfetsBRODSKY MARYJANE·Filed 2012·Application pending·0 cites
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