Inventor · disambiguated record
Takaaki Furuyama
Also filed as: FURUYAMA TAKAAKI
32 granted patents·1 pending application·360 citations·filing 1988–2011
97Inventor score
Top patents by PatentIndex Score
33 records- 0188US6310825B1Data writing method for semiconductor memory deviceFUJITSU LTD·Filed 2000·Granted Oct 30, 2001·50 cites·12 claims
- 0284US6097658ADRAM with reduced electric power consumptionFUJITSU LTD·Filed 1998·Granted Aug 1, 2000·49 cites·4 claims
- 0379US7068555B2Semiconductor memory storage device and a redundancy control method thereforSPANSION LLC·Filed 2005·Granted Jun 27, 2006·12 cites·15 claims
- 0479US6917541B2Nonvolatile semiconductor memory deviceFUJITSU LTD·Filed 2002·Granted Jul 12, 2005·28 cites·47 claims
- 0576US8023341B2Method and apparatus for address allotting and verification in a semiconductor deviceSPANSION LLC·Filed 2010·Granted Sep 20, 2011·4 cites·12 claims
- 0676US5909407AWord line multi-selection circuit for a memory deviceFUJITSU LTD·Filed 1998·Granted Jun 1, 1999·38 cites·27 claims
- 0773US6643758B2Flash memory capable of changing bank configurationFUJITSU LTD·Filed 2001·Granted Nov 4, 2003·21 cites·15 claims
- 0872US5594699ADRAM with reduced electric power consumptionFUJITSU LTD·Filed 1994·Granted Jan 14, 1997·25 cites·4 claims
- 0971US7415568B2Method and apparatus for initialization control in a non-volatile memory deviceSPANSION LLC·Filed 2005·Granted Aug 19, 2008·8 cites·12 claims
- 1067US7452771B2Method for fabricating a semiconductor deviceFUJITSU LTD·Filed 2005·Granted Nov 18, 2008·3 cites·6 claims
- 1167US7212443B2Non-volatile memory and write method of the sameSPANSION LLC·Filed 2005·Granted May 1, 2007·6 cites·34 claims
- 1265US5787046ASemiconductor memory device provided with block write functionFUJITSU LTD·Filed 1996·Granted Jul 28, 1998·25 cites·7 claims
- 1363US7061816B2Semiconductor memory storage device and its redundant methodSPANSION LLC·Filed 2005·Granted Jun 13, 2006·5 cites·14 claims
- 1460US6490215B2Semiconductor memory device and refreshing method of semiconductor memory deviceFUJITSU LTD·Filed 2001·Granted Dec 3, 2002·11 cites·15 claims
- 1560US6128238ADirect sensing semiconductor memory deviceFUJITSU LTD·Filed 2000·Granted Oct 3, 2000·11 cites·16 claims
- 1659US6879521B2Threshold voltage adjustment method of non-volatile semiconductor memory device and non-volatile semiconductor memory deviceFUJITSU LTD·Filed 2003·Granted Apr 12, 2005·10 cites·20 claims
- 1758US7889573B2Time reduction of address setup/hold time for semiconductor memorySPANSION LLC·Filed 2008·Granted Feb 15, 2011·3 cites·16 claims
- 1857US6462997B2Circuit for resetting a pair of data buses of a semiconductor memory deviceFUJITSU LTD·Filed 2001·Granted Oct 8, 2002·8 cites·11 claims
- 1956US4989182ADynamic random access memory having dummy word line for facilitating reset of row address latchFUJITSU LTD·Filed 1988·Granted Jan 29, 1991·17 cites·9 claims
- 2054US6977411B2Semiconductor device comprising transistors having control gates and floating gate electrodesFUJITSU LTD·Filed 2003·Granted Dec 20, 2005·5 cites·19 claims
- 2151US7321515B2Memory device and control method thereforSPANSION LLC·Filed 2006·Granted Jan 22, 2008·2 cites·20 claims
- 2251US7239548B2Method and apparatus for applying bias to a storage deviceSPANSION LLC·Filed 2005·Granted Jul 3, 2007·2 cites·16 claims
- 2349US8279673B2Non-volatile semiconductor memoryFURUYAMA TAKAAKI·Filed 2009·Granted Oct 2, 2012·2 cites·6 claims
- 2449US7813154B2Method and apparatus for address allotting and verification in a semiconductor deviceSPANSION LLC·Filed 2008·Granted Oct 12, 2010·1 cites·9 claims
- 2548US7433219B2Method and apparatus for address allotting and verification in a semiconductor deviceSPANSION LLC·Filed 2006·Granted Oct 7, 2008·1 cites·20 claims
- 2642US7808808B2Nonvolatile memory device having a plurality of memory blocksSPANSION LLC·Filed 2008·Granted Oct 5, 2010·0 cites·18 claims
- 2741US8031537B2Time reduction of address setup/hold time for semiconductor memorySPANSION LLC·Filed 2011·Granted Oct 4, 2011·0 cites·20 claims
- 2838US7281180B2Memory system and test method thereforSPANSION LLC·Filed 2005·Granted Oct 9, 2007·0 cites·29 claims
- 2938US5708625AVoltage level detectorFUJITSU LTD·Filed 1995·Granted Jan 13, 1998·6 cites·12 claims
- 3037US8094478B2Nonvolatile memory device having a plurality of memory blocksFURUYAMA TAKAAKI·Filed 2010·Granted Jan 10, 2012·0 cites·16 claims
- 3137US4932000ASemiconductor memory device having pseudo row decoderFUJITSU LTD·Filed 1989·Granted Jun 5, 1990·5 cites·12 claims
- 3237US2005149792A1Semiconductor device and method for testing the sameFUJITSU LTD·Filed 2005·Application pending·0 cites
- 3332US6198680B1Circuit for resetting a pair of data buses of a semiconductor memory deviceFUJITSU LTD·Filed 1999·Granted Mar 6, 2001·2 cites·12 claims
Join the waitlist — get patent alerts
Get an alert when Takaaki Furuyama files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →