Inventor · disambiguated record
Steven L. Hamren
Also filed as: HAMREN STEVEN L
23 granted patents·1 pending application·446 citations·filing 1996–2006
96Inventor score
Top patents by PatentIndex Score
24 records- 0196US6490188B2Semiconductor devices having mirrored terminal arrangements, devices including same, and methods of testing such semiconductor devicesMICRON TECHNOLOGY INC·Filed 2001·Granted Dec 3, 2002·168 cites·16 claims
- 0294US6307769B1Semiconductor devices having mirrored terminal arrangements, devices including same, and methods of testing such semiconductor devicesMICRON TECHNOLOGY INC·Filed 1999·Granted Oct 23, 2001·115 cites·26 claims
- 0377US7456504B2Electronic component assemblies with electrically conductive bondsMICRON TECHNOLOGY INC·Filed 2006·Granted Nov 25, 2008·5 cites·8 claims
- 0475US6579399B1Method and system for handling semiconductor componentsMICRON TECHNOLOGY INC·Filed 2000·Granted Jun 17, 2003·16 cites·23 claims
- 0571US5927503ATray for processing and/or shipping integrated circuit deviceMICRON TECHNOLOGY INC·Filed 1997·Granted Jul 27, 1999·33 cites·25 claims
- 0669US7135345B2Methods for processing semiconductor devices in a singulated formMICRON TECHNOLOGY INC·Filed 2004·Granted Nov 14, 2006·8 cites·63 claims
- 0764US7126228B2Apparatus for processing semiconductor devices in a singulated formMICRON TECHNOLOGY INC·Filed 2003·Granted Oct 24, 2006·7 cites·34 claims
- 0862US5731230AMethod for processing and/or shipping integrated circuit devicesMICRON TECHNOLOGY INC·Filed 1996·Granted Mar 24, 1998·23 cites·16 claims
- 0961US7122389B2Method for processing semiconductor devices in a singulated formMICRON TECHNOLOGY INC·Filed 2004·Granted Oct 17, 2006·5 cites·9 claims
- 1061US6504390B2Conductive bump array contactors having an ejector and methods of testing using sameMICRON TECHNOLOGY INC·Filed 2001·Granted Jan 7, 2003·5 cites·26 claims
- 1160US6442056B2Semiconductor devices having mirrored terminal arrangements, devices including same, and methods of testing such semiconductor devicesMICRON TECHNOLOGY INC·Filed 2001·Granted Aug 27, 2002·9 cites·7 claims
- 1258US6504391B2Conductive bump array contactors having an ejector and methods of testing using sameMICRON TECHNOLOGY INC·Filed 2001·Granted Jan 7, 2003·4 cites·23 claims
- 1354US6459288B2Conductive bump array contactors having an ejector and methods of testing using sameMICRON TECHNOLOGY INC·Filed 2001·Granted Oct 1, 2002·3 cites·20 claims
- 1453US6265886B1Conductive bump array contactors having an ejector and methods of testing using sameMICRON TECHNOLOGY INC·Filed 1999·Granted Jul 24, 2001·9 cites·11 claims
- 1550US6492826B2Conductive bump array contactors having an ejector and methods of testing using sameMICRON TECHNOLOGY INC·Filed 2001·Granted Dec 10, 2002·2 cites·18 claims
- 1650US6388459B2Conductive bump array contactors having an ejector and methods of testing using sameMICRON TECHNOLOGY INC·Filed 2001·Granted May 14, 2002·2 cites·8 claims
- 1748US7129721B2Method and apparatus for processing semiconductor devices in a singulated formHAMREN STEVEN L·Filed 2004·Granted Oct 31, 2006·3 cites·20 claims
- 1848US6543512B1Carrier, method and system for handling semiconductor componentsMICRON TECHNOLOGY INC·Filed 1998·Granted Apr 8, 2003·12 cites·29 claims
- 1948US6259263B1Compliant contactor for testing semiconductorsMICRON TECHNOLOGY INC·Filed 1999·Granted Jul 10, 2001·13 cites·17 claims
- 2041US6362639B2Compliant contactor for testing semiconductorsMICRON TECHNOLOGY INC·Filed 2001·Granted Mar 26, 2002·2 cites·11 claims
- 2139US6483332B2Conductive bump array contactors having an ejector and methods of testing using sameMICRON TECHNOLOGY INC·Filed 2001·Granted Nov 19, 2002·0 cites·21 claims
- 2239US6459289B2Conductive bump array contactors having an ejector and methods of testing using sameMICRON TECHNOLOGY INC·Filed 2001·Granted Oct 1, 2002·0 cites·16 claims
- 2334US2006284631A1Imaging test socket, system, and method of testing an image sensor deviceHAMREN STEVEN L·Filed 2005·Application pending·0 cites
- 2429US6293817B1Extended length, high frequency contactor blockMICRON TECHNOLOGY INC·Filed 1999·Granted Sep 25, 2001·2 cites·37 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →