Inventor · disambiguated record
Terumine Hayashi
Also filed as: HAYASHI TERUMINE
9 granted patents·398 citations·filing 1984–1993
91Inventor score
Files withHITACHI LTD9
Top patents by PatentIndex Score
9 records- 0186US5657242AMethod of determining routes for a plurality of wiring connections and a circuit board produced by such a methodHITACHI LTD·Filed 1993·Granted Aug 12, 1997·148 cites·28 claims
- 0283US5200908APlacement optimizing method/apparatus and apparatus for designing semiconductor devicesHITACHI LTD·Filed 1990·Granted Apr 6, 1993·62 cites·25 claims
- 0378US4701922AIntegrated circuit deviceHITACHI LTD·Filed 1985·Granted Oct 20, 1987·35 cites·13 claims
- 0471US5144563AMethod and apparatus for optimizing element placement and method and apparatus for deciding the optimal element placementHITACHI LTD·Filed 1990·Granted Sep 1, 1992·60 cites·8 claims
- 0568US4613970AIntegrated circuit device and method of diagnosing the sameHITACHI LTD·Filed 1984·Granted Sep 23, 1986·21 cites·10 claims
- 0660US4960724AMethod for deleting unused gates and method for manufacturing master-slice semiconductor integrated circuit device using the deleting methodHITACHI LTD·Filed 1989·Granted Oct 2, 1990·32 cites·5 claims
- 0755US5329532ALogic circuit with additional circuit for carrying out delay testHITACHI LTD·Filed 1991·Granted Jul 12, 1994·18 cites·9 claims
- 0850US4710930AMethod and apparatus for diagnosing a LSI chipHITACHI LTD·Filed 1986·Granted Dec 1, 1987·12 cites·9 claims
- 0946US4956818AMemory incorporating logic LSI and method for testing the same LSIHITACHI LTD·Filed 1988·Granted Sep 11, 1990·10 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →