Inventor · disambiguated record
Dirk Aderhold
Also filed as: ADERHOLD DIRK
10 granted patents·1 pending application·262 citations·filing 1999–2015
91Inventor score
Top patents by PatentIndex Score
11 records- 0198US7557360B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Jul 7, 2009·67 cites·28 claims
- 0296US8110814B2Ion sources, systems and methodsWARD BILLY W·Filed 2009·Granted Feb 7, 2012·33 cites·20 claims
- 0394US7488952B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Feb 10, 2009·20 cites·23 claims
- 0494US7485873B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Feb 3, 2009·36 cites·25 claims
- 0589US9236225B2Ion sources, systems and methodsCARL ZEISS MICROSCOPY LLC·Filed 2015·Granted Jan 12, 2016·4 cites·23 claims
- 0687US6599570B1Monolith coating apparatus and method thereforJOHNSON MATTHEY PLC·Filed 1999·Granted Jul 29, 2003·74 cites·3 claims
- 0778US7323054B2Apparatus for coating a monolith supportJOHNSON MATTHEY PLC·Filed 2003·Granted Jan 29, 2008·16 cites·19 claims
- 0876US8748845B2Ion sources, systems and methodsWARD BILLY W·Filed 2012·Granted Jun 10, 2014·2 cites·28 claims
- 0971US9012867B2Ion sources, systems and methodsCARL ZEISS MICROSCOPY LLC·Filed 2014·Granted Apr 21, 2015·1 cites·20 claims
- 1071US7147892B2Monolith coating apparatus and method thereforJOHNSON MATTHEY PLC·Filed 2003·Granted Dec 12, 2006·9 cites·21 claims
- 1127US2003082031A1Wafer handling device and method for testing wafersFiled 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →