Inventor · disambiguated record
Masaru Doi
Also filed as: DOI MASARU
18 granted patents·1 pending application·149 citations·filing 1986–2010
94Inventor score
Top patents by PatentIndex Score
19 records- 0185US7945826B2Test apparatus and test methodADVANTEST CORP·Filed 2009·Granted May 17, 2011·21 cites·11 claims
- 0283US7406646B2Multi-strobe apparatus, testing apparatus, and adjusting methodADVANTEST CORP·Filed 2005·Granted Jul 29, 2008·15 cites·13 claims
- 0380US7461316B2Multi-strobe generation apparatus, test apparatus and adjustment methodADVANTEST CORP·Filed 2005·Granted Dec 2, 2008·10 cites·20 claims
- 0477US7765449B2Test apparatus that tests a plurality of devices under test having plural memory cells and test method thereforADVANTEST CORP·Filed 2007·Granted Jul 27, 2010·9 cites·14 claims
- 0577US7216271B2Testing apparatus and a testing methodADVANTEST CORP·Filed 2005·Granted May 8, 2007·9 cites·10 claims
- 0675US7010729B2Timing generator and test apparatusADVANTEST CORP·Filed 2004·Granted Mar 7, 2006·22 cites·14 claims
- 0773US7203611B2Timing generator, test apparatus and skew adjusting methodADVANTEST CORP·Filed 2005·Granted Apr 10, 2007·7 cites·9 claims
- 0869US6990613B2Test apparatusADVANTEST CORP·Filed 2004·Granted Jan 24, 2006·14 cites·9 claims
- 0967US7640127B2Detection apparatus, detection method, and programADVANTEST CORP·Filed 2005·Granted Dec 29, 2009·5 cites·15 claims
- 1066US7634695B2Test apparatus and selection apparatusADVANTEST CORP·Filed 2007·Granted Dec 15, 2009·6 cites·9 claims
- 1165US7805641B2Test apparatus for regulating a test signal supplied to a device under test and method thereofADVANTEST CORP·Filed 2007·Granted Sep 28, 2010·4 cites·20 claims
- 1264US7407145B2Core for molding hollow ceramic molded body and light emitting containerNGK INSULATORS LTD·Filed 2005·Granted Aug 5, 2008·1 cites·11 claims
- 1363US7363556B2Testing apparatus and testing methodADVANTEST CORP·Filed 2005·Granted Apr 22, 2008·5 cites·12 claims
- 1463US7190174B2Method for calibrating timing clockADVANTEST CORP·Filed 2006·Granted Mar 13, 2007·4 cites·7 claims
- 1562US6953503B2Method of manufacturing molded body, slurry for molding, core for molding, method of manufacturing core for molding, hollow ceramic molded body, and light emitting containerNGK INSULATORS LTD·Filed 2002·Granted Oct 11, 2005·5 cites·15 claims
- 1656US7283920B2Apparatus and method for testing semiconductor deviceADVANTEST CORP·Filed 2003·Granted Oct 16, 2007·7 cites·54 claims
- 1740US4772967AMagnetic recording apparatus in a helical scan systemSANYO ELECTRIC CO·Filed 1986·Granted Sep 20, 1988·5 cites·11 claims
- 1838US2008052584A1Test apparatus and test methodADVANTEST CORP·Filed 2007·Application pending·0 cites
- 1925US8601329B2Test apparatus and test methodDOI MASARU·Filed 2010·Granted Dec 3, 2013·0 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →