Inventor · disambiguated record
Martin Koxxy
Also filed as: KOXXY MARTIN · KOXXY MARTIN J
24 granted patents·3 pending applications·1,184 citations·filing 1992–2013
98Inventor score
Top patents by PatentIndex Score
27 records- 0198US6256882B1Membrane probing systemCASCADE MICROTECH INC·Filed 1998·Granted Jul 10, 2001·118 cites·35 claims
- 0297US7009383B2Wafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 2004·Granted Mar 7, 2006·113 cites·8 claims
- 0396US6930498B2Membrane probing systemCASCADE MICROTECH INC·Filed 2004·Granted Aug 16, 2005·68 cites·1 claims
- 0495US7148711B2Membrane probing systemCASCADE MICROTECH INC·Filed 2005·Granted Dec 12, 2006·25 cites·1 claims
- 0595US6636059B2Wafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 2002·Granted Oct 21, 2003·57 cites·15 claims
- 0695US6486687B2Wafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 2002·Granted Nov 26, 2002·59 cites·7 claims
- 0795US5604444AWafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 1996·Granted Feb 18, 1997·107 cites·9 claims
- 0894US6801047B2Wafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 2003·Granted Oct 5, 2004·51 cites·9 claims
- 0994US6380751B2Wafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 2001·Granted Apr 30, 2002·54 cites·22 claims
- 1094US5532609AWafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 1995·Granted Jul 2, 1996·89 cites·10 claims
- 1193US8451017B2Membrane probing method using improved contactGLEASON K REED·Filed 2010·Granted May 28, 2013·21 cites·21 claims
- 1293US7266889B2Membrane probing systemCASCADE MICROTECH INC·Filed 2005·Granted Sep 11, 2007·20 cites·1 claims
- 1393US5266889AWafer probe station with integrated environment control enclosureCASCADE MICROTECH INC·Filed 1992·Granted Nov 30, 1993·172 cites·6 claims
- 1492US6708386B2Method for probing an electrical device having a layer of oxide thereonCASCADE MICROTECH INC·Filed 2001·Granted Mar 23, 2004·34 cites·9 claims
- 1591US7348787B2Wafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 2005·Granted Mar 25, 2008·11 cites·8 claims
- 1690US7595632B2Wafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 2008·Granted Sep 29, 2009·9 cites·9 claims
- 1790US6838890B2Membrane probing systemCASCADE MICROTECH INC·Filed 2000·Granted Jan 4, 2005·34 cites·36 claims
- 1889US6860009B2Probe construction using a recessCASCADE MICROTECH INC·Filed 2001·Granted Mar 1, 2005·26 cites·29 claims
- 1988US7403025B2Membrane probing systemCASCADE MICROTECH INC·Filed 2006·Granted Jul 22, 2008·12 cites·6 claims
- 2086US7681312B2Membrane probing systemCASCADE MICROTECH INC·Filed 2007·Granted Mar 23, 2010·8 cites·11 claims
- 2184US6313649B2Wafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 1997·Granted Nov 6, 2001·71 cites·7 claims
- 2277US7761986B2Membrane probing method using improved contactCASCADE MICROTECH INC·Filed 2003·Granted Jul 27, 2010·10 cites·6 claims
- 2372US6825677B2Membrane probing systemCASCADE MICROTECH INC·Filed 2001·Granted Nov 30, 2004·8 cites·23 claims
- 2466US7400155B2Membrane probing systemCASCADE MICROTECH INC·Filed 2004·Granted Jul 15, 2008·7 cites·8 claims
- 2558US2013321018A1Membrane probing method using improved contactCASCADE MICROTECH INC·Filed 2013·Application pending·0 cites
- 2652US2007245536A1Membrane probing systemCASCADE MICROTECH INC·Filed 2007·Application pending·0 cites
- 2747US2008252316A1Membrane probing systemCASCADE MICROTECH INC·Filed 2008·Application pending·0 cites
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