Inventor · disambiguated record
Yudong Hao
Also filed as: HAO YUDONG
4 granted patents·3 pending applications·15 citations·filing 2007–2024
66Inventor score
Top patents by PatentIndex Score
7 records- 0176US7450225B1Correction of optical metrology for focus offsetNANOMETRICS INC·Filed 2007·Granted Nov 11, 2008·11 cites·33 claims
- 0270US8126694B2Modeling conductive patterns using an effective modelLIU ZHUAN·Filed 2008·Granted Feb 28, 2012·4 cites·32 claims
- 0358US2025271779A1Modeling substrate characteristics from manufacturing sensor dataAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 0457US2025210385A1Using un-patterned and patterned metrology targets for in situ process monitoringAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 0555US12489005B2Temperature-based metrology calibration at a manufacturing systemAPPLIED MATERIALS INC·Filed 2022·Granted Dec 2, 2025·0 cites·14 claims
- 0655US12386342B2Holistic analysis of multidimensional sensor data for substrate processing equipmentAPPLIED MATERIALS INC·Filed 2022·Granted Aug 12, 2025·0 cites·20 claims
- 0755US2024404851A1Multi-target design for in-situ analysis of semiconductor fabrication processAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →