Inventor · disambiguated record
Jochem Sebastiaan Wildenberg
Also filed as: WILDENBERG JOCHEM SEBASTIAAN
24 granted patents·10 pending applications·65 citations·filing 2014–2025
94Inventor score
Files withASML NETHERLANDS BV34
Top patents by PatentIndex Score
34 records- 0197US11940740B2Methods and apparatus for obtaining diagnostic information relating to an industrial processASML NETHERLANDS BV·Filed 2022·Granted Mar 26, 2024·2 cites·20 claims
- 0297US10642162B2Methods and apparatus for obtaining diagnostic information relating to an industrial processASML NETHERLANDS BV·Filed 2019·Granted May 5, 2020·8 cites·23 claims
- 0397US9946165B2Methods and apparatus for obtaining diagnostic information relating to an industrial processASML NETHERLANDS BV·Filed 2014·Granted Apr 17, 2018·19 cites·20 claims
- 0496US10274834B2Methods and apparatus for obtaining diagnostic information relating to an industrial processASML NETHERLANDS BV·Filed 2018·Granted Apr 30, 2019·15 cites·20 claims
- 0593US9811006B2Method of determining a measurement subset of metrology points on a substrate, associated apparatus and computer programASML NETHERLANDS BV·Filed 2014·Granted Nov 7, 2017·9 cites·20 claims
- 0688US10802408B2Method for optimization of a lithographic processASML NETHERLANDS BV·Filed 2017·Granted Oct 13, 2020·3 cites·23 claims
- 0787US12287584B2Methods and apparatus for obtaining diagnostic information relating to an industrial processASML NETHERLANDS BV·Filed 2023·Granted Apr 29, 2025·0 cites·20 claims
- 0885US2025264813A1Methods and apparatus for obtaining diagnostic information relating to an industrial processASML NETHERLANDS BV·Filed 2025·Application pending·0 cites
- 0982US11378891B2Method for determining contribution to a fingerprintASML NETHERLANDS BV·Filed 2020·Granted Jul 5, 2022·1 cites·20 claims
- 1079US11294289B2Selecting a set of locations associated with a measurement or feature on a substrateASML NETHERLANDS BV·Filed 2017·Granted Apr 5, 2022·2 cites·20 claims
- 1179US10816904B2Method for determining contribution to a fingerprintASML NETHERLANDS BV·Filed 2018·Granted Oct 27, 2020·2 cites·26 claims
- 1276US11170072B2Method and apparatus for inspection and metrologyASML NETHERLANDS BV·Filed 2016·Granted Nov 9, 2021·2 cites·21 claims
- 1375US11106141B2Optimizing a sequence of processes for manufacturing of product unitsASML NETHERLANDS BV·Filed 2018·Granted Aug 31, 2021·1 cites·21 claims
- 1474US11385550B2Methods and apparatus for obtaining diagnostic information relating to an industrial processASML NETHERLANDS BV·Filed 2020·Granted Jul 12, 2022·0 cites·20 claims
- 1571US11669017B2Method for controlling a manufacturing apparatus and associated apparatusesASML NETHERLANDS BV·Filed 2018·Granted Jun 6, 2023·1 cites·20 claims
- 1671US11442367B2Optimizing a sequence of processes for manufacturing of product unitsASML NETHERLANDS BV·Filed 2021·Granted Sep 13, 2022·0 cites·20 claims
- 1769US11681231B2Selecting a set of locations associated with a measurement or feature on a substrateASML NETHERLANDS BV·Filed 2022·Granted Jun 20, 2023·0 cites·20 claims
- 1866US11480884B2Method for optimization of a lithographic processASML NETHERLANDS BV·Filed 2020·Granted Oct 25, 2022·0 cites·20 claims
- 1961US2022027437A1Method and apparatus for inspection and metrologyASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
- 2059US11435673B2Method of determining a set of metrology points on a substrate, associated apparatus and computer programASML NETHERLANDS BV·Filed 2020·Granted Sep 6, 2022·0 cites·20 claims
- 2158US11796920B2Method for controlling a manufacturing process and associated apparatusesASML NETHERLANDS BV·Filed 2021·Granted Oct 24, 2023·0 cites·20 claims
- 2256US2024036479A1Method of determining at least a target layout and associated metrology apparatusASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 2355US10809631B2Method of monitoring and device manufacturing methodASML NETHERLANDS BV·Filed 2018·Granted Oct 20, 2020·0 cites·21 claims
- 2455US2024402618A1Method of determining a performance parameter distributionASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 2554US2023141495A1Method of determining a sampling scheme, associated apparatus and computer programASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
- 2653US2024152059A1A method for modeling measurement data over a substrate area and associated apparatusesASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 2751US2023400778A1Methods and computer programs for configuration of a sampling scheme generation modelASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
- 2849US2022413391A1Method and apparatus for determining control data for a lithographic apparatusASML NETHERLANDS BV·Filed 2020·Application pending·0 cites
- 2947US11327406B2Estimating a parameter of a substrateASML NETHERLANDS BV·Filed 2019·Granted May 10, 2022·0 cites·20 claims
- 3046US10928737B2Method for characterizing distortions in a lithographic process, lithographic apparatus, lithographic cell and computer programASML NETHERLANDS BV·Filed 2017·Granted Feb 23, 2021·0 cites·20 claims
- 3146US10725372B2Method and apparatus for reticle optimizationASML NETHERLANDS BV·Filed 2016·Granted Jul 28, 2020·0 cites·20 claims
- 3244US2024118629A1Methods of fitting measurement data to a model and modeling a performance parameter distribution and associated apparatusesASML NETHERLANDS BV·Filed 2020·Application pending·0 cites
- 3342US11300887B2Method to change an etch parameterASML NETHERLANDS BV·Filed 2017·Granted Apr 12, 2022·0 cites·20 claims
- 3439US2019311921A1A processing apparatus and a method for correcting a parameter variation across a substrateASML NETHERLANDS BV·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →