Inventor · disambiguated record
Yukinori Sumi
Also filed as: SUMI YUKINORI
5 granted patents·121 citations·filing 1996–2001
82Inventor score
Files withFUJITSU LTD5
Top patents by PatentIndex Score
5 records- 0172US6246249B1Semiconductor inspection apparatus and inspection method using the apparatusFUJITSU LTD·Filed 1997·Granted Jun 12, 2001·38 cites·4 claims
- 0272US5767528ASemiconductor device including pad portion for testingFUJITSU LTD·Filed 1996·Granted Jun 16, 1998·46 cites·21 claims
- 0371US6333638B1Semiconductor test apparatus and test method using the sameFUJITSU LTD·Filed 1997·Granted Dec 25, 2001·29 cites·20 claims
- 0455US6518784B2Test method using semiconductor test apparatusFUJITSU LTD·Filed 2001·Granted Feb 11, 2003·6 cites·27 claims
- 0545US6388461B2Semiconductor inspection apparatus and inspection method using the apparatusFUJITSU LTD·Filed 2001·Granted May 14, 2002·2 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →