Inventor · disambiguated record
Hirokatsu Niijima
Also filed as: NIIJIMA HIROKATSU
10 granted patents·2 pending applications·93 citations·filing 1996–2007
89Inventor score
Files withADVANTEST CORP12
Top patents by PatentIndex Score
12 records- 0186US7002334B2Jitter measuring apparatus and a testing apparatusADVANTEST CORP·Filed 2005·Granted Feb 21, 2006·16 cites·9 claims
- 0283US7100099B2Test apparatusADVANTEST CORP·Filed 2006·Granted Aug 29, 2006·14 cites·15 claims
- 0381US7447955B2Test apparatus and test methodADVANTEST CORP·Filed 2005·Granted Nov 4, 2008·14 cites·8 claims
- 0470US7409615B2Test apparatus and test methodADVANTEST CORP·Filed 2006·Granted Aug 5, 2008·8 cites·6 claims
- 0562US6768954B2Jitter quantity calculator and testerADVANTEST CORP·Filed 2003·Granted Jul 27, 2004·8 cites·16 claims
- 0661US7197682B2Semiconductor test device and timing measurement methodADVANTEST CORP·Filed 2004·Granted Mar 27, 2007·10 cites·11 claims
- 0756US7262627B2Measuring apparatus, measuring method, and test apparatusADVANTEST CORP·Filed 2006·Granted Aug 28, 2007·3 cites·13 claims
- 0847US5955907ATemperature compensation circuit and method for providing a constant delayADVANTEST CORP·Filed 1997·Granted Sep 21, 1999·10 cites·2 claims
- 0941US5732047ATiming comparator circuit for use in device testing apparatusADVANTEST CORP·Filed 1996·Granted Mar 24, 1998·10 cites·7 claims
- 1035US2008228417A1Changing point detecting circuit, jitter measuring apparatus and test apparatusADVANTEST CORP·Filed 2007·Application pending·0 cites
- 1135US2008229163A1Test apparatus, test method and machine readable medium storing a program thereforADVANTEST CORP·Filed 2007·Application pending·0 cites
- 1231US8014969B2Test apparatus, test method and manufacturing methodADVANTEST CORP·Filed 2007·Granted Sep 6, 2011·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →