Inventor · disambiguated record
Robert J. Rathert
Also filed as: RATHERT ROBERT J
11 granted patents·1 pending application·32 citations·filing 2017–2022
83Inventor score
Top patents by PatentIndex Score
12 records- 0194US10761128B2Methods and systems for inline parts average testing and latent reliability defect detectionKLA TENCOR CORP·Filed 2017·Granted Sep 1, 2020·23 cites·20 claims
- 0293US11614480B2System and method for Z-PAT defect-guided statistical outlier detection of semiconductor reliability failuresKLA CORP·Filed 2021·Granted Mar 28, 2023·3 cites·29 claims
- 0390US11293970B2Advanced in-line part average testingKLA CORP·Filed 2020·Granted Apr 5, 2022·4 cites·31 claims
- 0475US10867877B2Targeted recall of semiconductor devices based on manufacturing dataKLA TENCOR CORP·Filed 2018·Granted Dec 15, 2020·2 cites·29 claims
- 0556US11899065B2System and method to weight defects with co-located modeled faultsKLA CORP·Filed 2022·Granted Feb 13, 2024·0 cites·32 claims
- 0653US12422376B2Imaging reflectometry for inline screeningKLA CORP·Filed 2021·Granted Sep 23, 2025·0 cites·44 claims
- 0753US12332182B2System for automatic diagnostics and monitoring of semiconductor defect die screening performance through overlay of defect and electrical test dataKLA CORP·Filed 2022·Granted Jun 17, 2025·0 cites·42 claims
- 0851US11798827B2Systems and methods for semiconductor adaptive testing using inline defect part average testingKLA CORP·Filed 2021·Granted Oct 24, 2023·0 cites·25 claims
- 0951US11624775B2Systems and methods for semiconductor defect-guided burn-in and system level testsKLA CORP·Filed 2021·Granted Apr 11, 2023·0 cites·25 claims
- 1050US11754625B2System and method for identifying latent reliability defects in semiconductor devicesKLA CORP·Filed 2021·Granted Sep 12, 2023·0 cites·27 claims
- 1149US11656274B2Systems and methods for evaluating the reliability of semiconductor die packagesKLA CORP·Filed 2021·Granted May 23, 2023·0 cites·35 claims
- 1242US2022196723A1System and method for automatically identifying defect-based test coverage gaps in semiconductor devicesKLA CORP·Filed 2021·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →