Inventor · disambiguated record
Ze'Ev Lindenfeld
Also filed as: Lindenfeld Ze'ev
2 granted patents·1 pending application·5 citations·filing 2016–2022
45Inventor score
Technology areasH10P
Top patents by PatentIndex Score
3 records- 0181US10831108B2Method of analyzing and utilizing landscapes to reduce or eliminate inaccuracy in overlay optical metrologyKLA CORP·Filed 2016·Granted Nov 10, 2020·5 cites·77 claims
- 0259US2022390858A1Time-domain optical metrology and inspection of semiconductor devicesNOVA LTD·Filed 2022·Application pending·0 cites
- 0352US11366398B2Time-domain optical metrology and inspection of semiconductor devicesNOVA LTD·Filed 2019·Granted Jun 21, 2022·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →