Inventor · disambiguated record
Khurram Zafar
Also filed as: ZAFAR KHURRAM
10 granted patents·378 citations·filing 2006–2021
90Inventor score
Top patents by PatentIndex Score
10 records- 0198US7570796B2Methods and systems for utilizing design data in combination with inspection dataKLA TENCOR TECH CORP·Filed 2006·Granted Aug 4, 2009·286 cites·88 claims
- 0297US9401014B2Methods and systems for utilizing design data in combination with inspection dataKLA-TENCOR TECH CORP·Filed 2014·Granted Jul 26, 2016·22 cites·103 claims
- 0391US8923600B2Methods and systems for utilizing design data in combination with inspection dataZAFAR KHURRAM·Filed 2009·Granted Dec 30, 2014·33 cites·23 claims
- 0490US9846934B2Pattern weakness and strength detection and tracking during a semiconductor device fabrication processANCHOR SEMICONDUCTOR INC·Filed 2016·Granted Dec 19, 2017·10 cites·17 claims
- 0589US10546085B2Pattern centric process controlANCHOR SEMICONDUCTOR INC·Filed 2018·Granted Jan 28, 2020·7 cites·39 claims
- 0686US9087367B2Determining design coordinates for wafer defectsCHANG ELLIS·Filed 2012·Granted Jul 21, 2015·11 cites·27 claims
- 0785US10997340B2Pattern centric process controlANCHOR SEMICONDUCTOR INC·Filed 2019·Granted May 4, 2021·5 cites·20 claims
- 0869US10062160B2Pattern weakness and strength detection and tracking during a semiconductor device fabrication processANCHOR SEMICONDUCTOR INC·Filed 2017·Granted Aug 28, 2018·1 cites·30 claims
- 0968US11694009B2Pattern centric process controlANCHOR SEMICONDUCTOR INC·Filed 2021·Granted Jul 4, 2023·0 cites·17 claims
- 1061US8989479B2Region based virtual fourier filterGAO LISHENG·Filed 2011·Granted Mar 24, 2015·3 cites·35 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →