Inventor · disambiguated record
Nobuhiro Obara
Also filed as: OBARA NOBUHIRO
8 granted patents·8 citations·filing 2008–2020
75Inventor score
Top patents by PatentIndex Score
8 records- 0189US11143600B2Defect inspection deviceHITACHI HIGH TECH CORP·Filed 2018·Granted Oct 12, 2021·6 cites·10 claims
- 0261US8558999B2Defect inspection apparatus and method utilizing multiple inspection conditionsKAWAKI KOJI·Filed 2008·Granted Oct 15, 2013·2 cites·2 claims
- 0355US12235223B2Method for defect inspection, system, and computer-readable mediumHITACHI HIGH TECH CORP·Filed 2020·Granted Feb 25, 2025·0 cites·7 claims
- 0454US12422377B2Defect inspection apparatus and defect inspection methodHITACHI HIGH TECH CORP·Filed 2020·Granted Sep 23, 2025·0 cites·9 claims
- 0552US12345661B2Defect inspection apparatus and defect inspection methodHITACHI HIGH TECH CORP·Filed 2019·Granted Jul 1, 2025·0 cites·13 claims
- 0650US12044627B2Defect inspection device and defect inspection methodHITACHI HIGH TECH CORP·Filed 2019·Granted Jul 23, 2024·0 cites·12 claims
- 0747US11346791B2Inspection device and inspection method thereofHITACHI HIGH TECH CORP·Filed 2018·Granted May 31, 2022·0 cites·7 claims
- 0837US9036141B2Surface inspection apparatus and surface inspection methodOBUCHI TERUMI·Filed 2012·Granted May 19, 2015·0 cites·9 claims
Join the waitlist — get patent alerts
Get an alert when Nobuhiro Obara files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →