Inventor · disambiguated record
Jerry J. Broz
Also filed as: BROZ JERRY · BROZ JERRY J
22 granted patents·12 pending applications·314 citations·filing 2001–2021
96Inventor score
Files withINT TEST SOLUTIONS INC18TEXAS INSTRUMENTS INC4INTERNAT TEST SOLUTIONS2BROZ JERRY1BROZ JERRY J1
Top patents by PatentIndex Score
34 records- 0198US10896828B2Wafer manufacturing cleaning apparatus, process and method of useINT TEST SOLUTIONS INC·Filed 2020·Granted Jan 19, 2021·6 cites·27 claims
- 0297US11035898B1Device and method for thermal stabilization of probe elements using a heat conducting waferINT TEST SOLUTIONS INC·Filed 2020·Granted Jun 15, 2021·7 cites·30 claims
- 0397US10406568B2Working surface cleaning system and methodINT TEST SOLUTIONS INC·Filed 2019·Granted Sep 10, 2019·9 cites·8 claims
- 0495US10109504B2Wafer manufacturing cleaning apparatus, process and method of useINT TEST SOLUTIONS INC·Filed 2017·Granted Oct 23, 2018·8 cites·4 claims
- 0595US9833818B2Working surface cleaning system and methodINT TEST SOLUTIONS INC·Filed 2013·Granted Dec 5, 2017·13 cites·8 claims
- 0694US10792713B1Pick and place machine cleaning system and methodINT TEST SOLUTIONS INC·Filed 2019·Granted Oct 6, 2020·11 cites·13 claims
- 0794US10741420B2Wafer manufacturing cleaning apparatus, process and method of useINT TEST SOLUTIONS INC·Filed 2018·Granted Aug 11, 2020·6 cites·7 claims
- 0894US10195648B2Apparatuses, device, and methods for cleaning tester interface contact elements and support hardwareINT TEST SOLUTIONS INC·Filed 2014·Granted Feb 5, 2019·15 cites·10 claims
- 0994US9595456B2Wafer manufacturing cleaning apparatus, process and method of useINT TEST SOLUTIONS INC·Filed 2013·Granted Mar 14, 2017·11 cites·18 claims
- 1094US8371316B2Apparatuses, device, and methods for cleaning tester interface contact elements and support hardwareINT TEST SOLUTIONS INC·Filed 2009·Granted Feb 12, 2013·22 cites·15 claims
- 1193US6906539B2High density, area array probe card apparatusTEXAS INSTRUMENTS INC·Filed 2001·Granted Jun 14, 2005·63 cites·18 claims
- 1292US10002776B2Wafer manufacturing cleaning apparatus, process and method of useINT TEST SOLUTIONS INC·Filed 2012·Granted Jun 19, 2018·9 cites·23 claims
- 1391US10239099B2Working surface cleaning system and methodINT TEST SOLUTIONS INC·Filed 2017·Granted Mar 26, 2019·3 cites·8 claims
- 1491US8801869B2Apparatuses, device, and methods for cleaning tester interface contact elements and support hardwareBROZ JERRY J·Filed 2011·Granted Aug 12, 2014·17 cites·8 claims
- 1590US6911834B2Multiple contact vertical probe solution enabling Kelvin connection benefits for conductive bump probingTEXAS INSTRUMENTS INC·Filed 2002·Granted Jun 28, 2005·63 cites·22 claims
- 1688US8790466B2Apparatuses, device, and methods for cleaning tester interface contact elements and support hardwareHUMPHREY ALAN E·Filed 2011·Granted Jul 29, 2014·16 cites·10 claims
- 1782US7202683B2Cleaning system, device and methodINTERNAT TEST SOLUTIONS·Filed 2004·Granted Apr 10, 2007·33 cites·11 claims
- 1858US11756811B2Pick and place machine cleaning system and methodINT TEST SOLUTIONS INC·Filed 2019·Granted Sep 12, 2023·0 cites·12 claims
- 1958US6752012B2Combined electrical test and mechanical test system for thin film characterizationTEXAS INSTRUMENTS INC·Filed 2002·Granted Jun 22, 2004·2 cites·9 claims
- 2058US2022093394A1System and method for cleaning contact elements and support hardware using functionalized surface microfeaturesINT TEST SOLUTIONS LLC·Filed 2021·Application pending·0 cites
- 2157US2021005484A1Pick and place machine cleaning system and methodINT TEST SOLUTIONS INC·Filed 2020·Application pending·0 cites
- 2254US11211242B2System and method for cleaning contact elements and support hardware using functionalized surface microfeaturesINT TEST SOLUTIONS INC·Filed 2019·Granted Dec 28, 2021·0 cites·11 claims
- 2353US2010132736A1Test Cell Conditioner (TCC) Surrogate Cleaning DeviceJTRON TECHNOLOGY CORP·Filed 2009·Application pending·0 cites
- 2449US2010258144A1Wafer manufacturing cleaning apparatus, process and method of useINTERNAT TEST SOLUTIONS·Filed 2010·Application pending·0 cites
- 2544US11318550B2System and method for cleaning wire bonding machines using functionalized surface microfeaturesINT TEST SOLUTIONS INC·Filed 2020·Granted May 3, 2022·0 cites·6 claims
- 2643US2021005499A1Pick and place machine cleaning system and methodINT TEST SOLUTIONS INC·Filed 2019·Application pending·0 cites
- 2743US2005140382A1High density, area array probe card apparatusFiled 2005·Application pending·0 cites
- 2843US2020200800A1Apparatuses, device, and methods for cleaning tester interface contact elements and support hardwareINT TEST SOLUTIONS·Filed 2018·Application pending·0 cites
- 2943US2021001378A1Pick and place machine cleaning system and methodINT TEST SOLUTIONS INC·Filed 2019·Application pending·0 cites
- 3042US2006065290A1Working surface cleaning system and methodBROZ JERRY·Filed 2005·Application pending·0 cites
- 3139US2005196900A1Substrate protection system, device and methodFiled 2004·Application pending·0 cites
- 3236US2004115934A1Method of improving contact resistanceFiled 2002·Application pending·0 cites
- 3335US6720780B2High density probe card apparatus and method of manufactureTEXAS INSTRUMENTS INC·Filed 2001·Granted Apr 13, 2004·0 cites·25 claims
- 3435US2004169521A1High density probe card apparatus and method of manufactureFiled 2004·Application pending·0 cites
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