Inventor · disambiguated record
Hideyuki Ozaki
Also filed as: OZAKI HIDEYUKI
18 granted patents·547 citations·filing 1981–1997
96Inventor score
Files withMITSUBISHI ELECTRIC CORP18
Top patents by PatentIndex Score
18 records- 0195US5319589ADynamic content addressable memory device and a method of operating thereofMITSUBISHI ELECTRIC CORP·Filed 1992·Granted Jun 7, 1994·143 cites·21 claims
- 0292US4575825ASemiconductor memory deviceMITSUBISHI ELECTRIC CORP·Filed 1984·Granted Mar 11, 1986·69 cites·11 claims
- 0390US4586167ASemiconductor memory deviceMITSUBISHI ELECTRIC CORP·Filed 1984·Granted Apr 29, 1986·55 cites·12 claims
- 0484US4455628ASubstrate bias generating circuitMITSUBISHI ELECTRIC CORP·Filed 1982·Granted Jun 19, 1984·33 cites·4 claims
- 0581US4833650ASemiconductor memory device including programmable mode selection circuitryMITSUBISHI ELECTRIC CORP·Filed 1987·Granted May 23, 1989·39 cites·8 claims
- 0674US4456939AInput protective circuit for semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1981·Granted Jun 26, 1984·18 cites·2 claims
- 0772US5875132ASemiconductor memory device for storing data comprising of plural bits and method for operating the sameMITSUBISHI ELECTRIC CORP·Filed 1990·Granted Feb 23, 1999·33 cites·10 claims
- 0871US4808844ASemiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1987·Granted Feb 28, 1989·37 cites·13 claims
- 0970US4593382AMOS dynamic memory deviceMITSUBISHI ELECTRIC CORP·Filed 1982·Granted Jun 3, 1986·19 cites·8 claims
- 1069US5796287AOutput driver circuit for suppressing noise generation and integrated circuit device for burn-in testMITSUBISHI ELECTRIC CORP·Filed 1993·Granted Aug 18, 1998·17 cites·11 claims
- 1166US4658379ASemiconductor memory device with a laser programmable redundancy circuitMITSUBISHI ELECTRIC CORP·Filed 1984·Granted Apr 14, 1987·17 cites·5 claims
- 1265US5621348AOutput driver circuit for suppressing noise generation and integrated circuit device for burn-in testMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Apr 15, 1997·16 cites·8 claims
- 1360US5757228AOutput driver circuit for suppressing noise generation and integrated circuit device for burn-in testMITSUBISHI ELECTRIC CORP·Filed 1997·Granted May 26, 1998·15 cites·9 claims
- 1458US4789966ASemiconductor memory device with page and nibble modesMITSUBISHI ELECTRIC CORP·Filed 1986·Granted Dec 6, 1988·16 cites·5 claims
- 1551US4641286AAuxiliary decoder for semiconductor memory deviceMITSUBISHI ELECTRIC CORP·Filed 1984·Granted Feb 3, 1987·8 cites·1 claims
- 1636US4835743ASemiconductor memory device performing multi-bit Serial operationMITSUBISHI ELECTRIC CORP·Filed 1987·Granted May 30, 1989·4 cites·14 claims
- 1733USRE35141ESubstrate bias generating circuitMITSUBISHI ELECTRIC CORP·Filed 1993·Granted Jan 9, 1996·3 cites·4 claims
- 1833US4551741ADram with polysi bit lines and added junction capacitanceMITSUBISHI ELECTRIC CORP·Filed 1983·Granted Nov 5, 1985·5 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →