Inventor · disambiguated record
Anjam Khursheed
Also filed as: KHURSHEED ANJAM
14 granted patents·1 pending application·204 citations·filing 1998–2018
92Inventor score
Files withUNIV SINGAPORE9NAT UNIV SINGAPORE3INST MATERIALS RESEARCH & ENG1INST OF MATERIALS RESEARCH & E1KHURSHEED ANJAM1
Top patents by PatentIndex Score
15 records- 0197US8013298B2Electrostatic electron spectrometry apparatusUNIV SINGAPORE·Filed 2009·Granted Sep 6, 2011·74 cites·21 claims
- 0293US7947951B2Multi-beam ion/electron spectra-microscopeUNIV SINGAPORE·Filed 2007·Granted May 24, 2011·22 cites·44 claims
- 0389US7294834B2Scanning electron microscopeUNIV SINGAPORE·Filed 2005·Granted Nov 13, 2007·13 cites·34 claims
- 0489US6320194B1Portable high resolution scanning electron microscope column using permanent magnet electron lensesINST MATERIALS RESEARCH & ENG·Filed 2000·Granted Nov 20, 2001·31 cites·8 claims
- 0581US9093243B2Gun configured to generate charged particlesUNIV SINGAPORE·Filed 2014·Granted Jul 28, 2015·4 cites·11 claims
- 0681US6057553APortable high resolution scanning electron microscope column using permanent magnet electron lensesINST OF MATERIALS RESEARCH & E·Filed 1998·Granted May 2, 2000·40 cites·8 claims
- 0776US9601304B2Aberration correction apparatus, device having the same, and method for correcting aberration of charged particlesNAT UNIV SINGAPORE·Filed 2015·Granted Mar 21, 2017·2 cites·24 claims
- 0872US8981292B2Parallel radial mirror analyser with an angled zero-volt equipotential exit grid for scanning electron microscopesKHURSHEED ANJAM·Filed 2012·Granted Mar 17, 2015·4 cites·11 claims
- 0970US7326928B2Electron microscope and a method of imaging objectsUNIV SINGAPORE·Filed 2005·Granted Feb 5, 2008·2 cites·23 claims
- 1063US8723114B2Sequential radial mirror analyserUNIV SINGAPORE·Filed 2012·Granted May 13, 2014·1 cites·17 claims
- 1163US6897441B2Reducing chromatic aberration in images formed by emmission electronsUNIV SINGAPORE·Filed 2003·Granted May 24, 2005·5 cites·31 claims
- 1258US6906335B2Lens for a scanning electron microscopeUNIV SINGAPORE·Filed 2001·Granted Jun 14, 2005·2 cites·7 claims
- 1353US6891159B2Converting scanning electron microscopesUNIV SINGAPORE·Filed 2003·Granted May 10, 2005·4 cites·20 claims
- 1448US11158479B2Cathode structure for cold field electron emission and method of fabricating the sameNAT UNIV SINGAPORE·Filed 2018·Granted Oct 26, 2021·0 cites·16 claims
- 1538US2019096629A1A corrector structure and a method for correcting aberration of an annular focused charged-particle beamNAT UNIV SINGAPORE·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →