Inventor · disambiguated record
Hideki Fukushima
Also filed as: FUKUSHIMA HIDEKI
13 granted patents·3 pending applications·21 citations·filing 2005–2017
86Inventor score
Top patents by PatentIndex Score
16 records- 0188US8422009B2Foreign matter inspection method and foreign matter inspection apparatusYAMASHITA HIROYUKI·Filed 2011·Granted Apr 16, 2013·6 cites·5 claims
- 0285US9329137B2Defect inspection method and device using sameHITACHI HIGH TECH CORP·Filed 2014·Granted May 3, 2016·4 cites·12 claims
- 0374US7719671B2Foreign matter inspection method and foreign matter inspection apparatusHITACHI HIGH TECH CORP·Filed 2007·Granted May 18, 2010·3 cites·6 claims
- 0471US10641156B2Exhaust pipe structureTOYOTA MOTOR CO LTD·Filed 2017·Granted May 5, 2020·2 cites·4 claims
- 0569US9606071B2Defect inspection method and device using sameHITACHI HIGH TECH CORP·Filed 2016·Granted Mar 28, 2017·1 cites·8 claims
- 0669US8402655B2Method of processing orificeHIGUMA MASATO·Filed 2010·Granted Mar 26, 2013·4 cites·10 claims
- 0766US10605146B2Exhaust mechanism for vehicleTOYOTA MOTOR CO LTD·Filed 2017·Granted Mar 31, 2020·1 cites·6 claims
- 0856US8834950B2Method for inhibiting the deterioration of eating-quality characteristics of foods containing gelatinized starchFUKUSHIMA HIDEKI·Filed 2007·Granted Sep 16, 2014·0 cites·5 claims
- 0955US7986405B2Foreign matter inspection method and foreign matter inspection apparatusHITACHI HIGH TECH CORP·Filed 2010·Granted Jul 26, 2011·0 cites·8 claims
- 1049US2008297786A1Inspecting device and inspecting methodHITACHI HIGH TECH CORP·Filed 2008·Application pending·0 cites
- 1145US10955361B2Defect inspection apparatus and pattern chipHITACHI HIGH TECH CORP·Filed 2017·Granted Mar 23, 2021·0 cites·6 claims
- 1243US10948424B2Defect inspection device, pattern chip, and defect inspection methodHITACHI HIGH TECH CORP·Filed 2016·Granted Mar 16, 2021·0 cites·18 claims
- 1343US2005264797A1Method and apparatus for detecting defectsNAKANO HIROYUKI·Filed 2005·Application pending·0 cites
- 1443US2008161399A1Agent for reduction of oxidized albumin levelAJINOMOTO KK·Filed 2008·Application pending·0 cites
- 1539US9176075B2Contamination inspection method and contamination inspection deviceGUNJI MASANORI·Filed 2010·Granted Nov 3, 2015·0 cites·19 claims
- 1635US8564767B2Defect inspecting apparatus and defect inspecting methodFUKUSHIMA HIDEKI·Filed 2011·Granted Oct 22, 2013·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →