Inventor · disambiguated record
Boris Habets
Also filed as: HABETS BORIS
12 granted patents·1 pending application·34 citations·filing 2007–2019
87Inventor score
Top patents by PatentIndex Score
13 records- 0184US10234401B2Method of manufacturing semiconductor devices by using sampling plansQONIAC GMBH·Filed 2016·Granted Mar 19, 2019·8 cites·23 claims
- 0283US9543223B2Method and apparatus for fabricating wafer by calculating process correction parametersHABETS BORIS·Filed 2013·Granted Jan 10, 2017·5 cites·7 claims
- 0381US8440475B2Alignment calculationHABETS BORIS·Filed 2008·Granted May 14, 2013·7 cites·15 claims
- 0478US7783444B2Systems and methods of alternative overlay calculationQIMONDA AG·Filed 2008·Granted Aug 24, 2010·7 cites·21 claims
- 0574US10739688B2Method and apparatus for fabricating wafer by calculating process correction parametersQONIAC GMBH·Filed 2019·Granted Aug 11, 2020·1 cites·2 claims
- 0674US10310490B2Method and apparatus of evaluating a semiconductor manufacturing processQONIAC GMBH·Filed 2016·Granted Jun 4, 2019·3 cites·10 claims
- 0769US10295914B2Method and apparatus for fabricating wafer by calculating process correction parametersHABETS BORIS·Filed 2016·Granted May 21, 2019·1 cites·1 claims
- 0868US10739685B2Process control method for lithographically processed semiconductor devicesQONIAC GMBH·Filed 2018·Granted Aug 11, 2020·1 cites·15 claims
- 0960US10008422B2Method for assessing the usability of an exposed and developed semiconductor waferQONIAC GMBH·Filed 2015·Granted Jun 26, 2018·1 cites·10 claims
- 1052US11366397B2Method and apparatus for simulation of lithography overlayQONIAC GMBH·Filed 2019·Granted Jun 21, 2022·0 cites·8 claims
- 1142US10379447B2Method and apparatus for simulation of lithography overlayHABETS BORIS·Filed 2013·Granted Aug 13, 2019·0 cites·9 claims
- 1237US10699971B2Method for processing of a further layer on a semiconductor waferQONIAC GMBH·Filed 2018·Granted Jun 30, 2020·0 cites·22 claims
- 1335US2008182344A1Method and system for determining deformations on a substrateMUELLER STEFFEN·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →