Inventor · disambiguated record
Toshiaki Mugibayashi
Also filed as: MUGIBAYASHI TOSHIAKI
8 granted patents·110 citations·filing 1998–2002
87Inventor score
Top patents by PatentIndex Score
8 records- 0186US6473665B2Defect analysis method and process control methodMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Oct 29, 2002·37 cites·9 claims
- 0271US6341241B1Defect analysis method and process control methodMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Jan 22, 2002·36 cites·20 claims
- 0368US6741940B2Computer-implemented method of defect analysisRENESAS TECH CORP·Filed 2002·Granted May 25, 2004·13 cites·12 claims
- 0467US6295126B1Inspection apparatus for foreign matter and pattern defectMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Sep 25, 2001·6 cites·5 claims
- 0565US6344897B2Inspection apparatus for foreign matter and pattern defectMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Feb 5, 2002·5 cites·4 claims
- 0658US6400038B2Alignment method and semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Jun 4, 2002·5 cites·2 claims
- 0742US6242318B1Alignment method and semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Jun 5, 2001·8 cites·12 claims
- 0837US6769111B2Computer-implemented method of process analysisRENESAS TECH CORP·Filed 2002·Granted Jul 27, 2004·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →