Inventor · disambiguated record
Renn-Shyan Yeh
Also filed as: YEH RENN-SHYAN
4 granted patents·112 citations·filing 1998–1999
77Inventor score
Files withTAIWAN SEMICONDUCTOR MFG4
Top patents by PatentIndex Score
4 records- 0186US6017771AMethod and system for yield loss analysis by yield management systemTAIWAN SEMICONDUCTOR MFG·Filed 1998·Granted Jan 25, 2000·80 cites·6 claims
- 0263US6389323B1Method and system for yield loss analysis by yield management systemTAIWAN SEMICONDUCTOR MFG·Filed 1999·Granted May 14, 2002·26 cites·6 claims
- 0330US6153497AMethod for determining a cause for defects in a film deposited on a waferTAIWAN SEMICONDUCTOR MFG·Filed 1999·Granted Nov 28, 2000·3 cites·18 claims
- 0429US6308576B1Method for determining stress effect on a film during scrubber cleanTAIWAN SEMICONDUCTOR MFG·Filed 1999·Granted Oct 30, 2001·3 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →