Inventor · disambiguated record
Eli Cheifetz
Also filed as: CHEIFETZ ELI
10 granted patents·1 pending application·38 citations·filing 2006–2021
85Inventor score
Files withEL MUL TECH LTD4EL MUL TECHNOLOGIES LTD3NOVA MEASURING INSTR INC2EL MULTECHNOLOGIES LTD1EL MUT TECHNOLOGIES LTD1
Top patents by PatentIndex Score
11 records- 0189US11183377B2Mass spectrometer detector and system and method using the sameNOVA MEASURING INSTR INC·Filed 2017·Granted Nov 23, 2021·6 cites·19 claims
- 0286US10236155B2Detection assembly, system and methodEL MUL TECH LTD·Filed 2016·Granted Mar 19, 2019·5 cites·21 claims
- 0386US7417235B2Particle detector for secondary ions and direct and or indirect secondary electronsEL MUL TECHNOLOGIES LTD·Filed 2006·Granted Aug 26, 2008·13 cites·18 claims
- 0478US9673019B2Electron detection systemEL-MUL TECH LTD·Filed 2015·Granted Jun 6, 2017·4 cites·23 claims
- 0577US11031210B2Charged particle detection systemEL MUL TECH LTD·Filed 2020·Granted Jun 8, 2021·1 cites·10 claims
- 0676US7847268B2Three modes particle detectorEL MUL TECHNOLOGIES LTD·Filed 2008·Granted Dec 7, 2010·5 cites·16 claims
- 0772US11823883B2Mass spectrometer detector and system and method using the sameNOVA MEASURING INSTR INC·Filed 2021·Granted Nov 21, 2023·0 cites·7 claims
- 0872US9076632B2Position sensitive STEM detectorEL MUT TECHNOLOGIES LTD·Filed 2013·Granted Jul 7, 2015·4 cites·20 claims
- 0960US11322333B2Charged particle detection systemEL MULTECHNOLOGIES LTD·Filed 2021·Granted May 3, 2022·0 cites·10 claims
- 1045US10910193B2Particle detection assembly, system and methodEL MUL TECH LTD·Filed 2019·Granted Feb 2, 2021·0 cites·18 claims
- 1142US2009309021A1Ion detection method and apparatus with scanning electron beamEL MUL TECHNOLOGIES LTD·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →