Inventor · disambiguated record
Eddie Williamson
Also filed as: WILLIAMSON EDDIE · WILLIAMSON EDDIE L · WILLIAMSON EDDIE L JR · WILLIAMSON EDDIE LEE
9 granted patents·2 pending applications·143 citations·filing 1987–2008
89Inventor score
Files withAGILENT TECHNOLOGIES INC7HEWLETT PACKARD CO2AGILENT TECHNOLOIGES INC1WILLIAMSON EDDIE LEE1
Top patents by PatentIndex Score
11 records- 0190US7057395B1Method for diagnosing open defects on non-contacted nodes of an electronic device from measurements of capacitively coupled nodesAGILENT TECHNOLOGIES INC·Filed 2005·Granted Jun 6, 2006·23 cites·18 claims
- 0286US7075307B1Method and apparatus for detecting shorts on inaccessible pins using capacitive measurementsAGILENT TECHNOLOGIES INC·Filed 2005·Granted Jul 11, 2006·16 cites·14 claims
- 0381US7737701B2Method and tester for verifying the electrical connection integrity of a component to a substrateAGILENT TECHNOLOGIES INC·Filed 2007·Granted Jun 15, 2010·13 cites·25 claims
- 0477US7242198B2Method for using internal semiconductor junctions to aid in non-contact testingAGILENT TECHNOLOGIES INC·Filed 2006·Granted Jul 10, 2007·8 cites·14 claims
- 0577US4779041AIntegrated circuit transfer test device systemHEWLETT PACKARD CO·Filed 1987·Granted Oct 18, 1988·36 cites·10 claims
- 0666US4779043AReversed IC test device and methodHEWLETT PACKARD CO·Filed 1987·Granted Oct 18, 1988·23 cites·5 claims
- 0759US7327148B2Method for using internal semiconductor junctions to aid in non-contact testingAGILENT TECHNOLOGIES INC·Filed 2005·Granted Feb 5, 2008·3 cites·1 claims
- 0853US6826721B2Data accelerator and methods for increasing data throughputAGILENT TECHNOLOIGES INC·Filed 2001·Granted Nov 30, 2004·9 cites·32 claims
- 0937US6324486B1Method and apparatus for adaptively learning test error sources to reduce the total number of test measurements required in real-timeAGILENT TECHNOLOGIES INC·Filed 1999·Granted Nov 27, 2001·12 cites·20 claims
- 1036US2009179657A1Printed circuit board for coupling probes to a tester, and apparatus and test system using sameWILLIAMSON EDDIE LEE·Filed 2008·Application pending·0 cites
- 1134US2009091342A1Node Extender for In-Circuit Test SystemsAGILENT TECHNOLOGIES INC·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →