Inventor · disambiguated record
Yoshio Sakitani
Also filed as: SAKITANI YOSHIO
12 granted patents·700 citations·filing 1972–1991
93Inventor score
Top patents by PatentIndex Score
12 records- 0196US4520421ASpecimen supporting deviceHITACHI LTD·Filed 1983·Granted May 28, 1985·362 cites·26 claims
- 0294US4589773APosition detecting systemNIPPON TELEGRAPH & TELEPHONE·Filed 1981·Granted May 20, 1986·87 cites·10 claims
- 0393US3952215AStepwise fine adjustmentHITACHI LTD·Filed 1972·Granted Apr 20, 1976·43 cites·10 claims
- 0490US4274035AField emission electron gunHITACHI LTD·Filed 1979·Granted Jun 16, 1981·28 cites·9 claims
- 0588US4019077AField emission electron gunHITACHI LTD·Filed 1975·Granted Apr 19, 1977·25 cites·13 claims
- 0686US4163168ATwo-directional piezoelectric driven fine adjusting deviceHITACHI LTD·Filed 1977·Granted Jul 31, 1979·36 cites·18 claims
- 0782US4020353ASample analysis apparatus using electron beam irradiationHITACHI LTD·Filed 1975·Granted Apr 26, 1977·23 cites·16 claims
- 0879US4099704AVacuum valve apparatusHITACHI LTD·Filed 1976·Granted Jul 11, 1978·32 cites·10 claims
- 0978US4090106AField emision electron gun with controlled power supplyHITACHI LTD·Filed 1976·Granted May 16, 1978·24 cites·7 claims
- 1075US4355232AApparatus for measuring specimen potential in electron microscopeHITACHI LTD·Filed 1980·Granted Oct 19, 1982·17 cites·11 claims
- 1161US4295072AField emission electron gun with anode heater and plural exhaustsHITACHI LTD·Filed 1979·Granted Oct 13, 1981·8 cites·7 claims
- 1260US5117111AElectron beam measuring apparatusHITACHI LTD·Filed 1991·Granted May 26, 1992·15 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →