Inventor · disambiguated record
Patrick J. Mullarkey
Also filed as: MULLARKEY PATRICK · MULLARKEY PATRICK J · MULLARKEY PATRICK JAMES
87 granted patents·2 pending applications·1,905 citations·filing 1992–2025
99Inventor score
Files withMICRON TECHNOLOGY INC78SUNCOKE TECH & DEVELOPMENT LLC7LUNDE ARON2MICRON SEMICONDUCTOR INC1MULLARKEY PATRICK J1
Top patents by PatentIndex Score
89 records- 0197US6378079B1Computer system having memory device with adjustable data clockingMICRON TECHNOLOGY INC·Filed 2000·Granted Apr 23, 2002·135 cites·14 claims
- 0296US6556497B2Refresh controller and address remapping circuit and method for dual mode full/reduced density DRAMsMICRON TECHNOLOGY INC·Filed 2002·Granted Apr 29, 2003·79 cites·11 claims
- 0396US6365421B2Method and apparatus for storage of test results within an integrated circuitMICRON TECHNOLOGY INC·Filed 2000·Granted Apr 2, 2002·118 cites·41 claims
- 0495US12465973B2Use of residual iron within granulated metallic unit production facilities, and associated systems, devices, and methodsSUNCOKE TECH & DEVELOPMENT LLC·Filed 2024·Granted Nov 11, 2025·0 cites·18 claims
- 0595US12427569B2Continuous granulated metallic units production, and associated systems, devices, and methodsSUNCOKE TECH & DEVELOPMENT LLC·Filed 2024·Granted Sep 30, 2025·0 cites·11 claims
- 0695US12420335B2Low-carbon granulated metallic unitsSUNCOKE TECH & DEVELOPMENT LLC·Filed 2024·Granted Sep 23, 2025·0 cites·20 claims
- 0795US12403529B2Use of a basic oxygen furnace to produce granulated metallic units, and associated systems, devices, and methodsSUNCOKE TECH & DEVELOPMENT LLC·Filed 2024·Granted Sep 2, 2025·0 cites·13 claims
- 0895US12397346B2Low-sulfur granulated metallic unitsSUNCOKE TECH & DEVELOPMENT LLC·Filed 2024·Granted Aug 26, 2025·0 cites·20 claims
- 0995US12370599B2Treating cooling water in iron production facilities, and associated systems, devices, and methodsSUNCOKE TECH & DEVELOPMENT LLC·Filed 2024·Granted Jul 29, 2025·0 cites·20 claims
- 1095US6327196B1Synchronous memory device having an adjustable data clocking circuitMICRON TECHNOLOGY INC·Filed 2000·Granted Dec 4, 2001·77 cites·5 claims
- 1194US6243285B1ROM-embedded-DRAMMICRON TECHNOLOGY INC·Filed 2000·Granted Jun 5, 2001·52 cites·10 claims
- 1294US6194738B1Method and apparatus for storage of test results within an integrated circuitMICRON TECHNOLOGY INC·Filed 1998·Granted Feb 27, 2001·102 cites·51 claims
- 1393US6449203B1Refresh controller and address remapping circuit and method for dual mode full/reduced density DRAMsMICRON TECHNOLOGY INC·Filed 2001·Granted Sep 10, 2002·55 cites·12 claims
- 1492US6499111B2Apparatus for adjusting delay of a clock signal relative to a data signalMICRON TECHNOLOGY INC·Filed 2001·Granted Dec 24, 2002·53 cites·14 claims
- 1592US2025353076A1Use of a basic oxygen furnace to produce granulated metallic units, and associated systems, devices, and methodsSUNCOKE TECH & DEVELOPMENT LLC·Filed 2025·Application pending·0 cites
- 1691US6208577B1Circuit and method for refreshing data stored in a memory cellMICRON TECHNOLOGY INC·Filed 1999·Granted Mar 27, 2001·67 cites·30 claims
- 1791US5627478AApparatus for disabling and re-enabling access to IC test functionsMICRON TECHNOLOGY INC·Filed 1995·Granted May 6, 1997·59 cites·14 claims
- 1890US5631862ASelf current limiting antifuse circuitMICRON TECHNOLOGY INC·Filed 1996·Granted May 20, 1997·73 cites·18 claims
- 1989US6134137ARom-embedded-DRAMMICRON TECHNOLOGY INC·Filed 1998·Granted Oct 17, 2000·54 cites·14 claims
- 2087US6643789B2Computer system having memory device with adjustable data clocking using pass gatesMICRON TECHNOLOGY INC·Filed 2002·Granted Nov 4, 2003·33 cites·19 claims
- 2187US6130834ACircuit for programming antifuse bitsMICRON TECHNOLOGY INC·Filed 1999·Granted Oct 10, 2000·53 cites·24 claims
- 2286US6459635B1Apparatus and method for increasing test flexibility of a memory deviceMICRON TECHNOLOGY INC·Filed 2000·Granted Oct 1, 2002·33 cites·31 claims
- 2384US6373761B1Method and apparatus for multiple row activation in memory devicesMICRON TECHNOLOGY INC·Filed 2000·Granted Apr 16, 2002·25 cites·22 claims
- 2484US6255837B1Apparatus and method disabling and re-enabling access to IC test functionsMICRON TECHNOLOGY INC·Filed 2000·Granted Jul 3, 2001·18 cites·4 claims
- 2582US6252816B1Circuit and method for refreshing data stored in a memory cellMICRON TECHNOLOGY INC·Filed 2000·Granted Jun 26, 2001·24 cites·15 claims
- 2680US5264725ALow-current polysilicon fuseMICRON SEMICONDUCTOR INC·Filed 1992·Granted Nov 23, 1993·63 cites·4 claims
- 2779US6519201B2Refresh controller and address remapping circuit and method for dual mode full/reduced density DRAMsMICRON TECHNOLOGY INC·Filed 2002·Granted Feb 11, 2003·26 cites·6 claims
- 2879US6269451B1Method and apparatus for adjusting data timing by delaying clock signalMICRON TECHNOLOGY INC·Filed 1998·Granted Jul 31, 2001·58 cites·26 claims
- 2979US5732033AMethod and circuit for rapidly equilibrating paired digit lines of a memory device during testingMICRON TECHNOLOGY INC·Filed 1996·Granted Mar 24, 1998·34 cites·17 claims
- 3077US9104588B2Circuits, apparatuses, and methods for address scramblingMICRON TECHNOLOGY INC·Filed 2013·Granted Aug 11, 2015·5 cites·33 claims
- 3177US6410385B2ROM-embedded-DRAMMICRON TECHNOLOGY INC·Filed 2001·Granted Jun 25, 2002·13 cites·16 claims
- 3277US5706238ASelf current limiting antifuse circuitMICRON TECHNOLOGY INC·Filed 1997·Granted Jan 6, 1998·36 cites·12 claims
- 3376US6570400B2Method for disabling and re-enabling access to IC test functionsMICRON TECHNOLOGY INC·Filed 2002·Granted May 27, 2003·11 cites·11 claims
- 3476US5689455ACircuit for programming antifuse bitsMICRON TECHNOLOGY INC·Filed 1995·Granted Nov 18, 1997·29 cites·7 claims
- 3574US6359823B2Circuit and method for refreshing data stored in a memory cellMICRON TECHNOLOGY INC·Filed 2001·Granted Mar 19, 2002·15 cites·33 claims
- 3673US6185705B1Method and apparatus for checking the resistance of programmable elementsMICRON TECHNOLOGY INC·Filed 1997·Granted Feb 6, 2001·28 cites·27 claims
- 3773US6023434AMethod and apparatus for multiple row activation in memory devicesMICRON TECHNOLOGY INC·Filed 1998·Granted Feb 8, 2000·22 cites·8 claims
- 3872US6292421B1Method and apparatus for multiple row activation in memory devicesMICRON TECHNOLOGY INC·Filed 2000·Granted Sep 18, 2001·13 cites·27 claims
- 3971US6255838B1Apparatus and method for disabling and re-enabling access to IC test functionsMICRON TECHNOLOGY INC·Filed 2000·Granted Jul 3, 2001·9 cites·7 claims
- 4070US6192446B1Memory device with command bufferMICRON TECHNOLOGY INC·Filed 1998·Granted Feb 20, 2001·24 cites·27 claims
- 4170US6141276AApparatus and method for increasing test flexibility of a memory deviceMICRON TECHNOLOGY INC·Filed 1999·Granted Oct 31, 2000·24 cites·43 claims
- 4269US6826071B2Circuit for programming antifuse bitsMICRON TECHNOLOGY INC·Filed 2002·Granted Nov 30, 2004·14 cites·14 claims
- 4369US6385691B2Memory device with command buffer that allows internal command buffer jumpsMICRON TECHNOLOGY INC·Filed 2001·Granted May 7, 2002·14 cites·19 claims
- 4468US12314549B2Computer-readable media and methods for generating a geospatial image mapMICRON TECHNOLOGY INC·Filed 2021·Granted May 27, 2025·0 cites·19 claims
- 4568US6925021B2Refresh controller and address remapping circuit and method for dual mode full/reduced density DRAMsMICRON TECHNOLOGY INC·Filed 2002·Granted Aug 2, 2005·11 cites·7 claims
- 4668US6903991B2Circuit for programming antifuse bitsMICRON TECHNOLOGY INC·Filed 2002·Granted Jun 7, 2005·12 cites·7 claims
- 4768US5900764AEfficient Vccp supply with regulation for voltage controlMICRON TECHNOLOGY INC·Filed 1997·Granted May 4, 1999·23 cites·4 claims
- 4867US6701470B1Method for testing a memory device having different number of data pads than the testerMICRON TECHNOLOGY INC·Filed 2000·Granted Mar 2, 2004·15 cites·23 claims
- 4967US6055173ACircuit for programming antifuse bitsMICRON TECHNOLOGY INC·Filed 1997·Granted Apr 25, 2000·19 cites·8 claims
- 5066US6445605B1Circuit for programming antifuse bitsMICRON TECHNOLOGY INC·Filed 2000·Granted Sep 3, 2002·13 cites·11 claims
Showing the top 50 of 89 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →