Inventor · disambiguated record
James P. Di Sarro
Also filed as: DI SARRO JAMES · DI SARRO JAMES P · DI SARRO JAMES PAUL
36 granted patents·2 pending applications·86 citations·filing 2009–2023
96Inventor score
Top patents by PatentIndex Score
38 records- 0194US9905558B1Conductivity modulated drain extended MOSFETTEXAS INSTRUMENTS INC·Filed 2016·Granted Feb 27, 2018·10 cites·8 claims
- 0292US8841174B1Silicon controlled rectifier with integral deep trench capacitorIBM·Filed 2013·Granted Sep 23, 2014·12 cites·8 claims
- 0386US9006783B2Silicon controlled rectifier with integral deep trench capacitorIBM·Filed 2014·Granted Apr 14, 2015·6 cites·8 claims
- 0485US9064786B2Dual three-dimensional (3D) resistor and methods of formingIBM·Filed 2013·Granted Jun 23, 2015·7 cites·10 claims
- 0584US9869708B2Integrated circuit protection during high-current ESD testingIBM·Filed 2015·Granted Jan 16, 2018·3 cites·7 claims
- 0683US10763251B2ESD network comprising variable impedance discharge pathTEXAS INSTRUMENTS INC·Filed 2017·Granted Sep 1, 2020·4 cites·23 claims
- 0783US10249610B1IGBT coupled to a reverse bias device in seriesTEXAS INSTRUMENTS INC·Filed 2018·Granted Apr 2, 2019·4 cites·20 claims
- 0883US9377496B2Cancellation of secondary reverse reflections in a very-fast transmission line pulse systemIBM·Filed 2015·Granted Jun 28, 2016·2 cites·14 claims
- 0982US9413169B2Electrostatic discharge protection circuit with a fail-safe mechanismGLOBALFOUNDRIES INC·Filed 2014·Granted Aug 9, 2016·4 cites·20 claims
- 1082US9240471B2SCR with fin body regions for ESD protectionIBM·Filed 2013·Granted Jan 19, 2016·5 cites·16 claims
- 1179US8610249B2Non-planar capacitor and method of forming the non-planar capacitorDI SARRO JAMES P·Filed 2012·Granted Dec 17, 2013·5 cites·19 claims
- 1275US9219055B2Structure and method for dynamic biasing to improve ESD robustness of current mode logic (CML) driversDI SARRO JAMES P·Filed 2012·Granted Dec 22, 2015·3 cites·20 claims
- 1375US8680573B2Diode-triggered silicon controlled rectifier with an integrated diodeDI SARRO JAMES P·Filed 2012·Granted Mar 25, 2014·3 cites·15 claims
- 1474US9274155B2Cancellation of secondary reverse reflections in a very-fast transmission line pulse systemIBM·Filed 2012·Granted Mar 1, 2016·2 cites·18 claims
- 1572US8634174B2Gate dielectric breakdown protection during ESD eventsABOU-KHALIL MICHEL J·Filed 2011·Granted Jan 21, 2014·3 cites·14 claims
- 1672US8284530B1Electrostatic discharge (ESD) protection circuit and related apparatus and methodVASHCHENKO VLADISLAV·Filed 2009·Granted Oct 9, 2012·6 cites·12 claims
- 1769US8737028B2RC-triggered ESD clamp device with feedback for time constant adjustmentDI SARRO JAMES P·Filed 2011·Granted May 27, 2014·2 cites·18 claims
- 1868US8987073B2Self-protected metal-oxide-semiconductor field-effect transistorDI SARRO JAMES P·Filed 2012·Granted Mar 24, 2015·2 cites·9 claims
- 1966US11532609B2ESD device with fast response and high transient currentTEXAS INSTRUMENTS INC·Filed 2020·Granted Dec 20, 2022·0 cites·19 claims
- 2065US11139292B2Conductivity modulated drain extended MOSFETTEXAS INSTRUMENTS INC·Filed 2019·Granted Oct 5, 2021·0 cites·19 claims
- 2165US9059198B2Bi-directional silicon controlled rectifier structureIBM·Filed 2014·Granted Jun 16, 2015·1 cites·13 claims
- 2264US8946766B2Bi-directional silicon controlled rectifier structureIBM·Filed 2013·Granted Feb 3, 2015·1 cites·18 claims
- 2363US10359461B2Integrated circuit protection during high-current ESD testingIBM·Filed 2017·Granted Jul 23, 2019·0 cites·12 claims
- 2461US9435841B2Integrated circuit protection during high-current ESD testingCHANG SHUNHUA·Filed 2012·Granted Sep 6, 2016·1 cites·12 claims
- 2559US10529708B2Conductivity modulated drain extended MOSFETTEXAS INSTRUMENTS INC·Filed 2018·Granted Jan 7, 2020·0 cites·7 claims
- 2658US11114848B2ESD protection charge pump active clamp for low-leakage applicationsTEXAS INSTRUMENTS INC·Filed 2019·Granted Sep 7, 2021·0 cites·13 claims
- 2758US10756078B2Structure and method for dynamic biasing to improve ESD robustness of current mode logic (CML) driversIBM·Filed 2017·Granted Aug 25, 2020·0 cites·18 claims
- 2858US10396550B2ESD protection charge pump active clamp for low-leakage applicationsTEXAS INSTRUMENTS INC·Filed 2016·Granted Aug 27, 2019·0 cites·24 claims
- 2956US9620497B2Structure and method for dynamic biasing to improve ESD robustness of current mode logic (CML) driversIBM·Filed 2015·Granted Apr 11, 2017·0 cites·6 claims
- 3055US9536870B2SCR with fin body regions for ESD protectionGLOBALFOUNDRIES INC·Filed 2015·Granted Jan 3, 2017·0 cites·20 claims
- 3155US9263402B2Self-protected metal-oxide-semiconductor field-effect transistorGLOBALFOUNDRIES INC·Filed 2014·Granted Feb 16, 2016·0 cites·10 claims
- 3253US8809129B2Diode-triggered silicon controlled rectifier with an integrated diodeIBM·Filed 2013·Granted Aug 19, 2014·0 cites·11 claims
- 3353US2024372356A1Quasi-static esd clampTEXAS INSTRUMENTS INC·Filed 2023·Application pending·0 cites
- 3452US10861844B2ESD device with fast response and high transient currentTEXAS INSTRUMENTS INC·Filed 2017·Granted Dec 8, 2020·0 cites·15 claims
- 3552US10181463B2Structure and method for dynamic biasing to improve ESD robustness of current mode logic (CML) driversIBM·Filed 2015·Granted Jan 15, 2019·0 cites·16 claims
- 3649US2023238378A1Semiconductor protection devices with high area efficiencyTEXAS INSTRUMENTS INC·Filed 2022·Application pending·0 cites
- 3748US12027612B2SCR having selective well contactsTEXAS INSTRUMENTS INC·Filed 2021·Granted Jul 2, 2024·0 cites·22 claims
- 3842US9575115B2Methodology of grading reliability and performance of chips across waferGLOBALFOUNDRIES INC·Filed 2012·Granted Feb 21, 2017·0 cites·19 claims
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