Inventor · disambiguated record
Flavien Hirigoyen
Also filed as: HIRIGOYEN FLAVIEN
10 granted patents·1 pending application·83 citations·filing 2010–2016
86Inventor score
Files withSTMICROELECTRONICS (GRENOBLE 2) SAS3HIRIGOYEN FLAVIEN2ST MICROELECTRONICS GRENOBLE 22ST MICROELECTRONICS SA2ROY FRANCOIS1
Top patents by PatentIndex Score
11 records- 0194US9728659B2SPAD device with radiation blocking rings and vias and related arrays and methodsSTMICROELECTRONICS (RESEARCH & DEVELOPMENT) LTD·Filed 2015·Granted Aug 8, 2017·41 cites·18 claims
- 0293US8674283B2Image sensor with reduced optical crosstalkROY FRANCOIS·Filed 2011·Granted Mar 18, 2014·13 cites·23 claims
- 0392US8664578B2Image sensor with reduced crosstalk having an isolation region with a second trench in the electrically conductive material of a first trenchHIRIGOYEN FLAVIEN·Filed 2011·Granted Mar 4, 2014·18 cites·23 claims
- 0488US9099580B2Elementary image acquisition or display deviceHIRIGOYEN FLAVIEN·Filed 2012·Granted Aug 4, 2015·9 cites·28 claims
- 0570US9521304B2Multiple photosites pixel architectureSTMICROELECTRONICS (GRENOBLE 2) SAS·Filed 2015·Granted Dec 13, 2016·2 cites·18 claims
- 0649US9052560B2Nanoprojector panel formed of an array of liquid crystal cellsST MICROELECTRONICS SA·Filed 2013·Granted Jun 9, 2015·0 cites·8 claims
- 0747US2010289101A1Image sensorST MICROELECTRONICS SA·Filed 2010·Application pending·0 cites
- 0844US9865636B2Method of simultaneously manufacturing partially shielded pixelsSTMICROELECTRONICS (GRENOBLE 2) SAS·Filed 2016·Granted Jan 9, 2018·0 cites·22 claims
- 0943US9299733B2Image sensorST MICROELECTRONICS GRENOBLE 2·Filed 2015·Granted Mar 29, 2016·0 cites·20 claims
- 1041US10388686B2Image sensor including one or more microlenses provided within a metallization layerST MICROELECTRONICS GRENOBLE 2·Filed 2016·Granted Aug 20, 2019·0 cites·9 claims
- 1141US9595552B2Method of simultaneously manufacturing partially shielded pixelsSTMICROELECTRONICS (GRENOBLE 2) SAS·Filed 2015·Granted Mar 14, 2017·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →