Inventor · disambiguated record
Kazunari Kurita
Also filed as: KURITA KAZUNARI
31 granted patents·20 pending applications·167 citations·filing 2003–2024
95Inventor score
Top patents by PatentIndex Score
51 records- 0197US8063466B2Semiconductor substrate for solid-state image sensing device as well as solid-state image sensing device and method for producing the sameKURITA KAZUNARI·Filed 2007·Granted Nov 22, 2011·96 cites·5 claims
- 0282US10396120B2Method for producing semiconductor epitaxial wafer and method of producing solid-state imaging deviceSUMCO CORP·Filed 2016·Granted Aug 27, 2019·3 cites·6 claims
- 0382US8263484B2High resistivity silicon wafer and method for manufacturing the sameKURITA KAZUNARI·Filed 2010·Granted Sep 11, 2012·6 cites·20 claims
- 0479US11245014B2Method of producing epitaxial silicon wafer, epitaxial silicon wafer, and method of producing solid-state imaging deviceSUMCO CORP·Filed 2018·Granted Feb 8, 2022·2 cites·9 claims
- 0579US8357592B2Method and apparatus for manufacturing semiconductor substrate dedicated to semiconductor device, and method and apparatus for manufacturing semiconductor deviceSUMCO CORP·Filed 2010·Granted Jan 22, 2013·4 cites·5 claims
- 0678US7915145B2Silicon substrate and manufacturing method thereofSUMCO CORP·Filed 2009·Granted Mar 29, 2011·7 cites·9 claims
- 0778US2024282801A1Method of producing semiconductor epitaxial wafer, semiconductor epitaxial wafer, and method of producing solid-state image sensing deviceSUMCO CORP·Filed 2024·Application pending·0 cites
- 0878US2024297201A1Method of producing semiconductor epitaxial wafer, semiconductor epitaxial wafer, and method of producing solid-state image sensing deviceSUMCO CORP·Filed 2024·Application pending·0 cites
- 0977US8309436B2Method of producing epitaxial substrate with gettering for solid-state imaging device, and method of producing solid-state imaging device using same substrateKURITA KAZUNARI·Filed 2010·Granted Nov 13, 2012·4 cites·8 claims
- 1076US8101508B2Silicon substrate and manufacturing method thereofKURITA KAZUNARI·Filed 2009·Granted Jan 24, 2012·6 cites·4 claims
- 1176US7560163B2Silicon wafer and method for producing sameSUMCO CORP·Filed 2007·Granted Jul 14, 2009·4 cites·4 claims
- 1275US7244306B2Method for measuring point defect distribution of silicon single crystal ingotSUMITOMO MITSUBISHI SILICON·Filed 2003·Granted Jul 17, 2007·12 cites·14 claims
- 1372US8492193B2Semiconductor substrate for solid-state imaging sensing device as well as solid-state image sensing device and method for producing the sameKURITA KAZUNARI·Filed 2011·Granted Jul 23, 2013·2 cites·1 claims
- 1471US9847370B2Method of producing semiconductor epitaxial wafer, semiconductor epitaxial wafer, and method of producing solid-state image sensing deviceSUMCO CORP·Filed 2016·Granted Dec 19, 2017·1 cites·11 claims
- 1567US8124501B2Method of producing semiconductor waferKURITA KAZUNARI·Filed 2009·Granted Feb 28, 2012·2 cites·7 claims
- 1667US7993942B2Method of detecting heavy metal in semiconductor substrateSUMCO CORP·Filed 2009·Granted Aug 9, 2011·2 cites·7 claims
- 1767US7507640B2Method for producing silicon waferSUMCO CORP·Filed 2007·Granted Mar 24, 2009·2 cites·9 claims
- 1867US7074271B2Method of identifying defect distribution in silicon single crystal ingotSUMITOMO MITSUBISHI SILICON·Filed 2004·Granted Jul 11, 2006·7 cites·13 claims
- 1966US9281197B2Epitaxial substrate for solid-state imaging device with gettering sink, semiconductor device, back illuminated solid-state imaging device and manufacturing method thereofKURITA KAZUNARI·Filed 2009·Granted Mar 8, 2016·2 cites·12 claims
- 2065USRE49657EEpitaxial wafer manufacturing method and epitaxial waferSUMCO CORP·Filed 2020·Granted Sep 12, 2023·0 cites·16 claims
- 2165US10224203B2Method of producing semiconductor epitaxial wafer and method of producing solid-state image sensorSUMCO CORP·Filed 2015·Granted Mar 5, 2019·1 cites·10 claims
- 2263US8864907B2Silicon substrate and manufacturing method of the sameKURITA KAZUNARI·Filed 2009·Granted Oct 21, 2014·2 cites·7 claims
- 2363US7893434B2High frequency diode and method for producing sameSUMCO CORP·Filed 2008·Granted Feb 22, 2011·1 cites·5 claims
- 2461US2020203418A1Method of producing semiconductor epitaxial wafer, semiconductor epitaxial water, and method of producing solid-state image sensing deviceSUMCO CORP·Filed 2019·Application pending·0 cites
- 2561US2020127043A1Method of producing semiconductor epitaxial wafer, semiconductor epitaxial wafer, and method of producing solid-state image sensing deviceSUMCO CORP·Filed 2019·Application pending·0 cites
- 2657US10453682B2Epitaxial wafer manufacturing method and epitaxial waferSUMCO CORP·Filed 2018·Granted Oct 22, 2019·0 cites·4 claims
- 2757US2020127044A1Method for producing semiconductor epitaxial wafer, semiconductor epitaxial wafer, and method of producing solid-state image sensing deviceSUMCO CORP·Filed 2019·Application pending·0 cites
- 2856US10062569B2Epitaxial wafer manufacturing method and epitaxial waferSUMCO CORP·Filed 2014·Granted Aug 28, 2018·0 cites·8 claims
- 2956US7621996B2Silicon wafer and method for producing sameSUMCO CORP·Filed 2008·Granted Nov 24, 2009·0 cites·4 claims
- 3055US2010025799A1Wafer for backside illumination type solid imaging device, production method thereof and backside illumination type solid imaging deviceSUMCO CORP·Filed 2009·Application pending·0 cites
- 3154US2016181313A1Method of producing semiconductor epitaxial wafer, semiconductor epitaxial wafer, and method of producing solid-state image sensing deviceSUMCO CORP·Filed 2013·Application pending·0 cites
- 3253US7919776B2High frequency diode and method for producing sameSUMCO CORP·Filed 2007·Granted Apr 5, 2011·0 cites·3 claims
- 3352US2016181312A1Method of producing semiconductor epitaxial wafer, semiconductor epitaxial wafer, and method of producing solid-state image sensing deviceSUMCO CORP·Filed 2013·Application pending·0 cites
- 3452US2009289283A1Wafer For Backside Illumination Type Solid Imaging Device, Production Method Thereof And Backside Illumination Solid Imaging DeviceSUMCO CORP·Filed 2009·Application pending·0 cites
- 3552US2009235861A1Carbon-doped single crystal manufacturing methodSUMCO CORP·Filed 2009·Application pending·0 cites
- 3650US2016181311A1Method of producing semiconductor epitaxial wafer, semiconductor epitaxial wafer, and method of producing solid-state image sensing deviceKADONO TAKESHI·Filed 2013·Application pending·0 cites
- 3749US9496139B2Method of producing semiconductor epitaxial wafer, semiconductor epitaxial wafer, and method of producing solid-state image sensing deviceKADONO TAKESHI·Filed 2012·Granted Nov 15, 2016·0 cites·9 claims
- 3849US2009321883A1Silicon substrate for solid-state imaging device and method for manufacturing the sameSUMCO CORP·Filed 2009·Application pending·0 cites
- 3949US2009226736A1Method of manufacturing silicon substrateSUMCO CORP·Filed 2009·Application pending·0 cites
- 4047US10861709B2Method of evaluating impurity gettering capability of epitaxial silicon wafer and epitaxial silicon waferSUMCO CORP·Filed 2018·Granted Dec 8, 2020·0 cites·11 claims
- 4147US7879695B2Thin silicon wafer and method of manufacturing the sameSUMCO CORP·Filed 2009·Granted Feb 1, 2011·0 cites·6 claims
- 4247US2012329204A1Wafer for backside illumination type solid imaging device, production method thereof and backside illumination solid imaging deviceKURITA KAZUNARI·Filed 2012·Application pending·0 cites
- 4346US7960249B2Method for producing wafer for backside illumination type solid imaging deviceSUMCO CORP·Filed 2009·Granted Jun 14, 2011·0 cites·9 claims
- 4446US2010047953A1Method for producing wafer for backside illumination type solid imaging deviceSUMCO CORP·Filed 2009·Application pending·0 cites
- 4546US2009252944A1Silicon wafer and production method thereofSUMCO CORP·Filed 2009·Application pending·0 cites
- 4645US2009242939A1Wafer for backside illumination type solid imaging device, production method thereof and backside illumination solid imaging deviceSUMCO CORP·Filed 2009·Application pending·0 cites
- 4744US7803228B2Process for producing high-resistance silicon wafers and process for producing epitaxial wafers and SOI wafersSUMCO CORP·Filed 2004·Granted Sep 28, 2010·1 cites·8 claims
- 4840US8658516B2Method of producing silicon wafer, epitaxial wafer and solid state image sensor, and device for producing silicon waferKURITA KAZUNARI·Filed 2011·Granted Feb 25, 2014·0 cites·11 claims
- 4937US2011049664A1Epitaxial substrate for back-illuminated image sensor and manufacturing method thereofSUMCO CORP·Filed 2010·Application pending·0 cites
- 5034US2011300371A1Epitaxial substrate and method for producing sameOMOTE SHUICHI·Filed 2011·Application pending·0 cites
Showing the top 50 of 51 patent records by PatentIndex Score.
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