Inventor · disambiguated record
Clyde Maxwell Guest
Also filed as: GUEST CLYDE MAXWELL · GUEST III CLYDE M
7 granted patents·1 pending application·138 citations·filing 1996–2002
87Inventor score
Top patents by PatentIndex Score
8 records- 0177US7024031B1System and method for inspection using off-angle lightingAUGUST TECHNOLOGY CORP·Filed 2001·Granted Apr 4, 2006·20 cites·25 claims
- 0272US6765666B1System and method for inspecting bumped wafersSEMICONDUCTOR TECH & INSTR INC·Filed 2000·Granted Jul 20, 2004·18 cites·18 claims
- 0370US6252981B1System and method for selection of a reference dieSEMICONDUCTOR TECH & INSTR INC·Filed 1999·Granted Jun 26, 2001·41 cites·26 claims
- 0466US6459807B1System and method for locating irregular edges in image dataSEMICONDUCTOR TECH & INSTR INC·Filed 2000·Granted Oct 1, 2002·12 cites·20 claims
- 0565US6744913B1System and method for locating image featuresSEMICONDUCTOR TECHNOLOGY & INS·Filed 2000·Granted Jun 1, 2004·28 cites·13 claims
- 0661US7046837B2System and method for locating irregular edges in image dataAUGUST TECHNOLOGY CORP·Filed 2002·Granted May 16, 2006·8 cites·19 claims
- 0739US2001028734A1System and method for selection of a reference dieFiled 2001·Application pending·0 cites
- 0835US5838434ASemiconductor device lead calibration unitSEMICONDUCTOR TECH & INSTR INC·Filed 1996·Granted Nov 17, 1998·11 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →