Inventor · disambiguated record
Noel S. Poduje
Also filed as: PODUJE NOEL · PODUJE NOEL S · PODUJE NOEL STEPHEN
24 granted patents·1,337 citations·filing 1974–2005
97Inventor score
Top patents by PatentIndex Score
24 records- 0195US4750141AMethod and apparatus for separating fixture-induced error from measured object characteristics and for compensating the measured object characteristic with the error, and a bow/warp station implementing sameADE CORP·Filed 1985·Granted Jun 7, 1988·105 cites·27 claims
- 0295US4457664AWafer alignment stationADE CORP·Filed 1982·Granted Jul 3, 1984·133 cites·23 claims
- 0393US5511005AWafer handling and processing systemADE CORP·Filed 1994·Granted Apr 23, 1996·249 cites·31 claims
- 0493US5102280ARobot prealignerADE CORP·Filed 1989·Granted Apr 7, 1992·109 cites·28 claims
- 0592US5642298AWafer testing and self-calibration systemADE CORP·Filed 1996·Granted Jun 24, 1997·155 cites·11 claims
- 0691US3990005ACapacitive thickness gauging for ungrounded elementsADE CORP·Filed 1974·Granted Nov 2, 1976·46 cites·25 claims
- 0790US3986109ASelf-calibrating dimension gaugeADE CORP·Filed 1975·Granted Oct 12, 1976·45 cites·12 claims
- 0886US5988971AWafer transfer robotADE OPTICAL SYST CORP·Filed 1997·Granted Nov 23, 1999·87 cites·23 claims
- 0986US4958129APrealigner probeADE CORP·Filed 1989·Granted Sep 18, 1990·46 cites·19 claims
- 1084US7324917B2Method, system, and software for evaluating characteristics of a surface with reference to its edgeKLA TENCOR TECH CORP·Filed 2005·Granted Jan 29, 2008·13 cites·54 claims
- 1184US4158171AWafer edge detection systemADE CORP·Filed 1977·Granted Jun 12, 1979·33 cites·16 claims
- 1282US4918376AA.C. capacitive gauging systemADE CORP·Filed 1989·Granted Apr 17, 1990·41 cites·14 claims
- 1381US5456561ARobot prealignerADE CORP·Filed 1994·Granted Oct 10, 1995·62 cites·21 claims
- 1479US4217542ASelf inverting gauging systemADE CORP·Filed 1978·Granted Aug 12, 1980·26 cites·17 claims
- 1575US4860229AWafer flatness stationADE CORP·Filed 1988·Granted Aug 22, 1989·42 cites·21 claims
- 1671US5557267AApparatus and methods for measurement system calibrationADE CORP·Filed 1993·Granted Sep 17, 1996·23 cites·13 claims
- 1771US5332352ARobot prealignerADE CORP·Filed 1992·Granted Jul 26, 1994·40 cites·22 claims
- 1869US4849916AImproved spatial resolution measurement system and methodADE CORP·Filed 1985·Granted Jul 18, 1989·24 cites·27 claims
- 1957US4692695AConductivity-type sensorADE CORP·Filed 1986·Granted Sep 8, 1987·15 cites·6 claims
- 2054US6025787AApparatus and methods for measurement system calibrationADE CORP·Filed 1996·Granted Feb 15, 2000·14 cites·10 claims
- 2154US4910453AMulti-probe grouping system with nonlinear error correctionADE CORP·Filed 1987·Granted Mar 20, 1990·14 cites·11 claims
- 2247US4353029ASelf inverting gauging systemADE CORP·Filed 1980·Granted Oct 5, 1982·9 cites·6 claims
- 2345US4228392ASecond order correction in linearized proximity probeADE CORP·Filed 1977·Granted Oct 14, 1980·6 cites·18 claims
- 2434US7175214B2Wafer gripping fingers to minimize distortionADE CORP·Filed 2004·Granted Feb 13, 2007·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →