Inventor · disambiguated record
Boris Efraty
Also filed as: EFRATY BORIS
5 granted patents·10 citations·filing 2014–2016
70Inventor score
Top patents by PatentIndex Score
5 records- 0184US9874527B2Removing process-variation-related inaccuracies from scatterometry measurementsKLA TENCOR CORP·Filed 2015·Granted Jan 23, 2018·3 cites·19 claims
- 0281US10831108B2Method of analyzing and utilizing landscapes to reduce or eliminate inaccuracy in overlay optical metrologyKLA CORP·Filed 2016·Granted Nov 10, 2020·5 cites·77 claims
- 0367US10242290B2Method, system, and user interface for metrology target characterizationKLA TENCOR CORP·Filed 2014·Granted Mar 26, 2019·2 cites·24 claims
- 0444US10408602B2Quality estimation and improvement of imaging metrology targetsKLA TENCOR CORP·Filed 2016·Granted Sep 10, 2019·0 cites·10 claims
- 0534US10366483B2Wafer notch detectionKLA TENCOR CORP·Filed 2015·Granted Jul 30, 2019·0 cites·20 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →