Inventor · disambiguated record
Sen-Wei Tsai
Also filed as: TSAI SEN-WEI
4 granted patents·87 citations·filing 2002–2015
75Inventor score
Top patents by PatentIndex Score
4 records- 0191US7191373B2Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (DFD) techniquesSYNTEST TECHNOLOGIES INC·Filed 2002·Granted Mar 13, 2007·48 cites·19 claims
- 0286US7552373B2Method and apparatus for broadcasting scan patterns in a scan-based integrated circuitSYNTEST TECHNOLOGIES INC·Filed 2003·Granted Jun 23, 2009·36 cites·44 claims
- 0359US7721173B2Method and apparatus for broadcasting scan patterns in a scan-based integrated circuitSYNTEST TECHNOLOGIES INC·Filed 2009·Granted May 18, 2010·3 cites·47 claims
- 0453US9696377B2Method and apparatus for broadcasting scan patterns in a scan-based integrated circuitSYNTEST TECH INC·Filed 2015·Granted Jul 4, 2017·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →