Inventor · disambiguated record
Teresa Louise Mclaurin
Also filed as: MCLAURIN TERESA L · MCLAURIN TERESA LOUISE
12 granted patents·1 pending application·91 citations·filing 2000–2023
88Inventor score
Top patents by PatentIndex Score
13 records- 0189US6598192B1Method and apparatus for testing an integrated circuitMOTOROLA INC·Filed 2000·Granted Jul 22, 2003·47 cites·10 claims
- 0279US11568926B2Latch circuitry for memory applicationsADVANCED RISC MACH LTD·Filed 2020·Granted Jan 31, 2023·1 cites·20 claims
- 0375US7913131B2Scan chain cell with delay testing capabilityADVANCED RISC MACH LTD·Filed 2008·Granted Mar 22, 2011·8 cites·18 claims
- 0468US7080299B2Resetting latch circuits within a functional circuit and a test wrapper circuitADVANCED RISC MACH LTD·Filed 2003·Granted Jul 18, 2006·14 cites·20 claims
- 0566US10222418B2Scan cell for dual port memory applicationsADVANCED RISC MACH LTD·Filed 2016·Granted Mar 5, 2019·1 cites·18 claims
- 0664US7308631B2Wrapper serial scan chain functional segmentationADVANCED RISC MACH LTD·Filed 2002·Granted Dec 11, 2007·12 cites·14 claims
- 0761US10847211B2Latch circuitry for memory applicationsADVANCED RISC MACH LTD·Filed 2018·Granted Nov 24, 2020·1 cites·18 claims
- 0856US12499967B2Row repair circuitryADVANCED RISC MACH LTD·Filed 2023·Granted Dec 16, 2025·0 cites·20 claims
- 0952US7085978B2Validating test signal connections within an integrated circuitADVANCED RISC MACH LTD·Filed 2002·Granted Aug 1, 2006·6 cites·16 claims
- 1046US9612280B2Partial scan cellADVANCED RISC MACH LTD·Filed 2014·Granted Apr 4, 2017·0 cites·15 claims
- 1139US6999900B2Testing memory access signal connectionsADVANCED RISC MACH LTD·Filed 2004·Granted Feb 14, 2006·1 cites·20 claims
- 1235US8468405B2Integrated circuit testingMCLAURIN TERESA LOUISE·Filed 2010·Granted Jun 18, 2013·0 cites·16 claims
- 1329US2013256908A1Inter-die connection within an integrated circuit formed of a stack of circuit diesMCLAURIN TERESA LOUISE·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →