Inventor · disambiguated record
Steven D. Cummings
Also filed as: CUMMINGS STEVEN D
11 granted patents·256 citations·filing 1993–2005
92Inventor score
Files withMICRON TECHNOLOGY INC11
Top patents by PatentIndex Score
11 records- 0196US7122425B2Methods of forming semiconductor constructionsMICRON TECHNOLOGY INC·Filed 2004·Granted Oct 17, 2006·110 cites·47 claims
- 0290US7271413B2Semiconductor constructionsMICRON TECHNOLOGY INC·Filed 2005·Granted Sep 18, 2007·18 cites·10 claims
- 0387US6482736B1Methods for forming and integrated circuit structures containing enhanced-surface-area conductive layersMICRON TECHNOLOGY INC·Filed 2000·Granted Nov 19, 2002·30 cites·5 claims
- 0484US5371701AStacked delta cell capacitorMICRON TECHNOLOGY INC·Filed 1994·Granted Dec 6, 1994·43 cites·9 claims
- 0572US6534335B1Optimized low leakage diodes, including photodiodesMICRON TECHNOLOGY INC·Filed 1999·Granted Mar 18, 2003·27 cites·16 claims
- 0662US6838714B2Low leakage diodes, including photodiodesMICRON TECHNOLOGY INC·Filed 2001·Granted Jan 4, 2005·8 cites·108 claims
- 0752US7253102B2Methods for forming and integrated circuit structures containing enhanced-surface-area conductive layersMICRON TECHNOLOGY INC·Filed 2004·Granted Aug 7, 2007·3 cites·13 claims
- 0852US6812112B2Methods for forming and integrated circuit structures containing enhanced-surface-area conductive layersMICRON TECHNOLOGY INC·Filed 2001·Granted Nov 2, 2004·3 cites·8 claims
- 0950US7943505B2Advanced VLSI metallizationMICRON TECHNOLOGY INC·Filed 2004·Granted May 17, 2011·2 cites·26 claims
- 1049US6764943B2Methods for forming and integrated circuit structures containing enhanced-surface-area conductive layersMICRON TECHNOLOGY INC·Filed 2002·Granted Jul 20, 2004·2 cites·10 claims
- 1145US5321649AStacked delta cell capacitorMICRON TECHNOLOGY INC·Filed 1993·Granted Jun 14, 1994·10 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →