Inventor · disambiguated record
Lin Lee Cheong
Also filed as: CHEONG LIN LEE
16 granted patents·2 pending applications·25 citations·filing 2016–2025
88Inventor score
Top patents by PatentIndex Score
18 records- 0197US11295993B2Maintenance scheduling for semiconductor manufacturing equipmentPDF SOLUTIONS INC·Filed 2020·Granted Apr 5, 2022·6 cites·20 claims
- 0287US12124440B1Converting natural language queries to SQL queries using ontological codes and placeholdersAMAZON TECH INC·Filed 2021·Granted Oct 22, 2024·4 cites·20 claims
- 0386US11443083B2Identification of hot spots or defects by machine learningASML NETHERLANDS BV·Filed 2017·Granted Sep 13, 2022·2 cites·20 claims
- 0485US12505288B1Multi-machine learning system for interacting with a large language modelAMAZON TECH INC·Filed 2023·Granted Dec 23, 2025·1 cites·18 claims
- 0585US11029359B2Failure detection and classsification using sensor data and/or measurement dataPDF SOLUTIONS INC·Filed 2019·Granted Jun 8, 2021·8 cites·19 claims
- 0685US2025341785A1Identification of hot spots or defects by machine learningASML NETHERLANDS BV·Filed 2025·Application pending·0 cites
- 0782US11126092B2Methods for determining an approximate value of a processing parameter at which a characteristic of the patterning process has a target valueASML NETHERLANDS BV·Filed 2016·Granted Sep 21, 2021·3 cites·20 claims
- 0875US12360461B2Identification of hot spots or defects by machine learningASML NETHERLANDS BV·Filed 2022·Granted Jul 15, 2025·0 cites·20 claims
- 0974US12229945B2Wafer bin map based root cause analysisPDF SOLUTIONS INC·Filed 2023·Granted Feb 18, 2025·0 cites·19 claims
- 1072US10777470B2Selective inclusion/exclusion of semiconductor chips in accelerated failure testsPDF SOLUTIONS INC·Filed 2019·Granted Sep 15, 2020·1 cites·7 claims
- 1167US2025013636A1Converting natural language queries to sql queries using ontological codes and placeholdersAMAZON TECH INC·Filed 2024·Application pending·0 cites
- 1265US11763446B2Wafer bin map based root cause analysisPDF SOLUTIONS INC·Filed 2021·Granted Sep 19, 2023·0 cites·20 claims
- 1353US11775714B2Rational decision-making tool for semiconductor processesPDF SOLUTIONS INC·Filed 2021·Granted Oct 3, 2023·0 cites·27 claims
- 1451US11609812B2Anomalous equipment trace detection and classificationPDF SOLUTIONS INC·Filed 2020·Granted Mar 21, 2023·0 cites·9 claims
- 1549US12353837B1Customizable framework for natural language processing explainabilityAMAZON TECH INC·Filed 2023·Granted Jul 8, 2025·0 cites·20 claims
- 1648US11403453B2Defect predictionASML NETHERLANDS BV·Filed 2018·Granted Aug 2, 2022·0 cites·20 claims
- 1747US11022642B2Semiconductor yield predictionPDF SOLUTIONS INC·Filed 2018·Granted Jun 1, 2021·0 cites·18 claims
- 1846US12038802B2Collaborative learning model for semiconductor applicationsPDF SOLUTIONS INC·Filed 2020·Granted Jul 16, 2024·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →