Inventor · disambiguated record
Bryan Edward Cole
Also filed as: COLE BRYAN E · COLE BRYAN EDWARD
21 granted patents·4 pending applications·246 citations·filing 2001–2024
94Inventor score
Top patents by PatentIndex Score
25 records- 0193US7174037B2Imaging apparatus and methodTERAVIEW LTD·Filed 2001·Granted Feb 6, 2007·58 cites·24 claims
- 0290US7315175B2Probe apparatus and method for examining a sampleTERAVIEW LTD·Filed 2002·Granted Jan 1, 2008·45 cites·18 claims
- 0390US6865014B2Apparatus and method for investigating a sampleTERAVIEW LTD·Filed 2001·Granted Mar 8, 2005·41 cites·20 claims
- 0483US12392820B2Test system with adjustable delay line and radiation feedback controlTERAVIEW LTD·Filed 2024·Granted Aug 19, 2025·0 cites·10 claims
- 0583US12332297B2Test systemTERAVIEW LTD·Filed 2023·Granted Jun 17, 2025·0 cites·9 claims
- 0681US7214940B2Apparatus and method for investigating a sampleTERAVIEW LTD·Filed 2002·Granted May 8, 2007·21 cites·25 claims
- 0777US11921154B2Test systemTERAVIEW LTD·Filed 2022·Granted Mar 5, 2024·0 cites·13 claims
- 0877US7728296B2Spectroscopy apparatus and associated techniqueTERAVIEW LTD·Filed 2004·Granted Jun 1, 2010·19 cites·20 claims
- 0977US7152007B2Imaging apparatus and methodTERA VIEW LTD·Filed 2003·Granted Dec 19, 2006·20 cites·11 claims
- 1076US11726136B2Test systemTERAVIEW LTD·Filed 2021·Granted Aug 15, 2023·0 cites·19 claims
- 1173US7485863B2Method and apparatus for investigating a sampleTERAVIEW LTD·Filed 2004·Granted Feb 3, 2009·10 cites·22 claims
- 1273US7397428B2Coherent THz emitter with DC power reducing resistorTERAVIEW LTD·Filed 2003·Granted Jul 8, 2008·11 cites·26 claims
- 1370US7335883B2Imaging apparatus and methodTERAVIEW LTD·Filed 2002·Granted Feb 26, 2008·12 cites·48 claims
- 1465US11169202B2Test systemTERAVIEW LTD·Filed 2018·Granted Nov 9, 2021·0 cites·19 claims
- 1562US2025224331A1Method, system and sensor for analysing a sample, and process for manufacturing an electrodeTERAVIEW LTD·Filed 2023·Application pending·0 cites
- 1660US11366158B2Test system for testing the integrity of an electronic deviceTERAVIEW LTD·Filed 2016·Granted Jun 21, 2022·0 cites·16 claims
- 1760US2024328781A1Curvature correctionTERAVIEW LTD·Filed 2022·Application pending·0 cites
- 1859US10076261B2Imaging apparatus and methodARNONE DONALD DOMINIC·Filed 2001·Granted Sep 18, 2018·5 cites·7 claims
- 1958US9075002B2TeraHertz probe array imaging systemCOLE BRYAN E·Filed 2005·Granted Jul 7, 2015·1 cites·58 claims
- 2054US8665423B2Method and apparatus for investigating a non-planar sampleWITHERS MICHAEL J·Filed 2004·Granted Mar 4, 2014·3 cites·21 claims
- 2147US10006960B2Test systemCOLE BRYAN EDWARD·Filed 2012·Granted Jun 26, 2018·0 cites·23 claims
- 2244US9006660B2Scanning terahertz probeCOLE BRYAN EDWARD·Filed 2008·Granted Apr 14, 2015·0 cites·27 claims
- 2341US2003155512A1Apparatus and method for investigating a sampleFiled 2001·Application pending·0 cites
- 2438US9829433B2Imaging techniques and associated apparatusCOLE BRYAN E·Filed 2004·Granted Nov 28, 2017·0 cites·19 claims
- 2538US2008037031A1Terahertz Time Domain Sensing to Derive Physical Characteristics of an Object by Evaluating the Contribution of Surface Waves to the Reflected/Scattered Time Domain WaveformCOLE BRYAN E·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →