Inventor · disambiguated record
Shin Sakiyama
Also filed as: SAKIYAMA SHIN
14 granted patents·10 pending applications·66 citations·filing 2006–2025
90Inventor score
Files withADVANTEST CORP6NIHON MICRONICS KK5TYCO ELECTRONICS AMP KK5ONIYAMA KYOKO2MOLEX JAPAN CO LTD1
Top patents by PatentIndex Score
24 records- 0173US7202686B2Socket and test apparatusADVANTEST CORP·Filed 2006·Granted Apr 10, 2007·12 cites·16 claims
- 0269US8550854B2Edge connectorOKANO MASATO·Filed 2010·Granted Oct 8, 2013·8 cites·2 claims
- 0366US2025277811A1Electrical connection apparatusNIHON MICRONICS KK·Filed 2025·Application pending·0 cites
- 0466US2025277813A1Electrical connection apparatusNIHON MICRONICS KK·Filed 2025·Application pending·0 cites
- 0562US7544067B1Board mount-type connector and board mount-type connector assemblyTYCO ELECTRONICS AMP KK·Filed 2008·Granted Jun 9, 2009·8 cites·20 claims
- 0662US7474109B2Contact terminal for measurement, measurement apparatus, probe card set, wafer probe apparatus, and testing apparatusADVANTEST CORP·Filed 2006·Granted Jan 6, 2009·4 cites·18 claims
- 0760US2025258218A1Electrical connection apparatusNIHON MICRONICS KK·Filed 2025·Application pending·0 cites
- 0858US8860454B2Connector and semiconductor testing device including the connectorONIYAMA KYOKO·Filed 2010·Granted Oct 14, 2014·5 cites·3 claims
- 0956US11923321B2Three-dimensional memory device including dielectric rails for warpage reduction and method of making the sameSANDISK TECHNOLOGIES LLC·Filed 2022·Granted Mar 5, 2024·0 cites·20 claims
- 1055US2024420908A1Relay circuit and electrical connection apparatusNIHON MICRONICS KK·Filed 2024·Application pending·0 cites
- 1154USD584693SElectrical connectorTYCO ELECTRONICS AMP KK·Filed 2008·Granted Jan 13, 2009·9 cites·1 claims
- 1254US2024426903A1Electrical connection apparatusNIHON MICRONICS KK·Filed 2024·Application pending·0 cites
- 1353USD597951SElectrical connector housingTYCO ELECTRONICS AMP KK·Filed 2008·Granted Aug 11, 2009·10 cites·1 claims
- 1452US8657625B2Connector and semiconductor test deviceWAGATA HIROTAKA·Filed 2012·Granted Feb 25, 2014·3 cites·13 claims
- 1551US2016187413A1Cable assembly, connector and semiconductor testerMOLEX JAPAN CO LTD·Filed 2015·Application pending·0 cites
- 1647US8905788B2Connector and semiconductor testing device including the connectorONIYAMA KYOKO·Filed 2010·Granted Dec 9, 2014·2 cites·7 claims
- 1741US8790134B2Connector, cable assembly, and semiconductor testing deviceMOTOHASHI NOBUMASA·Filed 2010·Granted Jul 29, 2014·1 cites·14 claims
- 1841US2007007984A1Socket for inspection apparatusADVANTEST CORP·Filed 2006·Application pending·0 cites
- 1940US9170276B2Coaxial cable member coupled to a signal terminal, a ground terminal and an auxiliary ground conductor with an elastically-deformable pieceSUZUKI TERUHITO·Filed 2012·Granted Oct 27, 2015·0 cites·20 claims
- 2040US2007145994A1Socket and test apparatusADVANTEST CORP·Filed 2007·Application pending·0 cites
- 2137USD583769SElectrical connectorTYCO ELECTRONICS AMP KK·Filed 2008·Granted Dec 30, 2008·3 cites·1 claims
- 2236US2009128172A1Calibration board for electronic device test apparatusADVANTEST CORP·Filed 2006·Application pending·0 cites
- 2336US2011221464A1Contact probe and socket, and manufacturing method of tube plunger and contact probeADVANTEST CORP·Filed 2011·Application pending·0 cites
- 2431USD581876SElectrical connectorTYCO ELECTRONICS AMP KK·Filed 2008·Granted Dec 2, 2008·1 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →