Inventor · disambiguated record
Kazuhito Tsukagoshi
Also filed as: TSUKAGOSHI KAZUHITO
10 granted patents·10 pending applications·59 citations·filing 2000–2016
87Inventor score
Files withRIKEN7HIURA HIDEFUMI4NAT INST FOR MATERIALS SCIENCE2DAINIPPON PRINTING CO LTD1HITACHI LTD1
Top patents by PatentIndex Score
20 records- 0184US8980217B2Method of manufacturing graphene substrate, and graphene substrateHIURA HIDEFUMI·Filed 2011·Granted Mar 17, 2015·7 cites·18 claims
- 0281US8698077B2Method for determining number of layers of two-dimensional thin film atomic structure and device for determining number of layers of two-dimensional thin film atomic structureHIURA HIDEFUMI·Filed 2011·Granted Apr 15, 2014·4 cites·14 claims
- 0380US8043978B2Electronic device and method for producing electronic deviceRIKEN·Filed 2008·Granted Oct 25, 2011·11 cites·2 claims
- 0477US9825180B2Thin-film transistor and method for manufacturing sameNAT INST MATERIALS SCIENCE·Filed 2016·Granted Nov 21, 2017·2 cites·4 claims
- 0577US9741864B2Thin-film transistor and method for manufacturing sameNAT INST FOR MATERIALS SCIENCE·Filed 2014·Granted Aug 22, 2017·3 cites·14 claims
- 0673US6833980B1Magnetoelectric deviceHITACHI LTD·Filed 2000·Granted Dec 21, 2004·22 cites·19 claims
- 0765US7939453B2Method for manufacturing organic transistor and organic transistorDAINIPPON PRINTING CO LTD·Filed 2009·Granted May 10, 2011·3 cites·5 claims
- 0863US8835286B2Manufacturing method of graphene substrate and graphene substrateHIURA HIDEFUMI·Filed 2011·Granted Sep 16, 2014·1 cites·16 claims
- 0958US7241987B2Probe for near-field microscope, the method for manufacturing the probe and scanning probe microscope using the probeSII NANOTECHNOLOGY INC·Filed 2005·Granted Jul 10, 2007·6 cites·4 claims
- 1049US2008203271A1Method of manufacturing a replica mold and a replica moldRIKEN·Filed 2007·Application pending·0 cites
- 1149US2008203620A1Method of forming minute patternRIKEN·Filed 2007·Application pending·0 cites
- 1247US2012161098A1Substrate, manufacturing method of substrate, semiconductor element, and manufacturing method of semiconductor elementHIURA HIDEFUMI·Filed 2009·Application pending·0 cites
- 1347US2008202163A1Material for high refractive index glass, high refractive index glass obtained from the material, and method of patterning high refractive index glassRIKEN·Filed 2007·Application pending·0 cites
- 1446US2016056409A1Organic el element and method for manufacturing sameNAT INST FOR MATERIALS SCIENCE·Filed 2014·Application pending·0 cites
- 1544US2008315190A1Organic Thin Film Transistor and Method for Surface Modification of Gate Insulating Layer of Organic Thin Film TransistorRIKEN·Filed 2006·Application pending·0 cites
- 1643US2010078639A1Thin film semiconductor device fabrication method and thin film semiconductor deviceSONY CORP·Filed 2008·Application pending·0 cites
- 1741US2009039563A1Method of forming fine patternRIKEN·Filed 2006·Application pending·0 cites
- 1839US2004245527A1Terminal and thin-film transistorFiled 2004·Application pending·0 cites
- 1937US2008017400A1Element, Thin Film Transistor and Sensor Using the Same, and Method of Manufacturing ElementRIKEN·Filed 2005·Application pending·0 cites
- 2034US7301159B2Charged particle beam apparatus and method of forming electrodes having narrow gap therebetween by using the sameRIKEN & SII NANOTECHNOLOGY INC·Filed 2005·Granted Nov 27, 2007·0 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →