Inventor · disambiguated record
Fuchao Wang
Also filed as: WANG FUCHAO
30 granted patents·10 pending applications·148 citations·filing 2000–2024
96Inventor score
Files withTEXAS INSTRUMENTS INC14ST MICROELECTRONICS INC11LE NEEL OLIVIER3ST MICROELECTRONICS ASIA PACIFIC PTE LTD3FANG MING2
Top patents by PatentIndex Score
40 records- 0197US8927909B2Closed loop temperature controlled circuit to improve device stabilityLE NEEL OLIVIER·Filed 2010·Granted Jan 6, 2015·30 cites·16 claims
- 0290US8242876B2Dual thin film precision resistance trimmingLE NEEL OLIVIER·Filed 2009·Granted Aug 14, 2012·25 cites·19 claims
- 0390US7881594B2Heating system and method for microfluidic and micromechanical applicationsSTMICROELETRONICS INC·Filed 2007·Granted Feb 1, 2011·10 cites·13 claims
- 0488US8493171B2Dual thin film precision resistance trimmingLE NEEL OLIVIER·Filed 2012·Granted Jul 23, 2013·11 cites·18 claims
- 0587US9165853B2Closed loop temperature controlled circuit to improve device stabilityST MICROELECTRONICS ASIA·Filed 2014·Granted Oct 20, 2015·6 cites·20 claims
- 0684US10403424B2Method to form magnetic core for integrated magnetic devicesTEXAS INSTRUMENTS INC·Filed 2017·Granted Sep 3, 2019·2 cites·20 claims
- 0780US10206247B2Closed loop temperature controlled circuit to improve device stabilityST MICROELECTRONICS ASIA PACIFIC PTE LTD·Filed 2015·Granted Feb 12, 2019·2 cites·20 claims
- 0878US6953925B2Microlens integrationST MICROELECTRONICS INC·Filed 2003·Granted Oct 11, 2005·28 cites·8 claims
- 0975US11856657B2Closed loop temperature controlled circuit to improve device stabilityST MICROELECTRONICS ASIA PACIFIC PTE LTD·Filed 2021·Granted Dec 26, 2023·0 cites·20 claims
- 1075US9899334B1Methods and apparatus for alignment marksTEXAS INSTRUMENTS INC·Filed 2016·Granted Feb 20, 2018·4 cites·15 claims
- 1175US7964474B2Use of field oxidation to simplify chamber fabrication in microfluidic devicesST MICROELECTRONICS INC·Filed 2009·Granted Jun 21, 2011·4 cites·19 claims
- 1274US2024407268A1Thin Film Anisotropic Magnetoresistor Device and FormationTEXAS INSTRUMENTS INC·Filed 2024·Application pending·0 cites
- 1370US8110117B2Method to form a recess for a microfluidic deviceWANG FUCHAO·Filed 2009·Granted Feb 7, 2012·4 cites·19 claims
- 1469US11443879B2Magnetic core for integrated magnetic devicesTEXAS INSTRUMENTS INC·Filed 2019·Granted Sep 13, 2022·0 cites·23 claims
- 1567US12069956B2Thin film anisotropic magnetoresistor device and formationTEXAS INSTRUMENTS INC·Filed 2021·Granted Aug 20, 2024·0 cites·17 claims
- 1666US6350684B1Graded/stepped silicide process to improve MOS transistorST MICROELECTRONICS INC·Filed 2000·Granted Feb 26, 2002·11 cites·19 claims
- 1764US8798448B2Heating system and method for microfluidic and micromechanical applicationsFANG MING·Filed 2010·Granted Aug 5, 2014·1 cites·21 claims
- 1863US10654714B2Heating system and method for microfluidic and micromechanical applicationsST MICROELECTRONICS INC·Filed 2016·Granted May 19, 2020·0 cites·21 claims
- 1963US9305688B2Single photomask high precision thin film resistorTEXAS INSTRUMENTS INC·Filed 2013·Granted Apr 5, 2016·1 cites·11 claims
- 2061US11140750B2Closed loop temperature controlled circuit to improve device stabilityST MICROELECTRONICS ASIA PACIFIC PTE LTD·Filed 2018·Granted Oct 5, 2021·0 cites·19 claims
- 2161US2025372529A1Iii-n semiconductor device with reduced scribeline vulnerabilityTEXAS INSTRUMENTS INC·Filed 2024·Application pending·0 cites
- 2260US9434166B2Heating system and method for microfluidic and micromechanical applicationsST MICROELECTRONICS INC·Filed 2014·Granted Sep 6, 2016·0 cites·20 claims
- 2359US9842895B2Single photomask high precision thin film resistorTEXAS INSTRUMENTS INC·Filed 2016·Granted Dec 12, 2017·0 cites·10 claims
- 2459US9443801B2Method to reduce metal fuse thickness without extra maskST MICROELECTRONICS INC·Filed 2015·Granted Sep 13, 2016·1 cites·14 claims
- 2557US7514714B2Thin film power MOS transistor, apparatus, and methodST MICROELECTRONICS INC·Filed 2006·Granted Apr 7, 2009·1 cites·20 claims
- 2655US8925835B2Microfluidic nozzle formation and process flowFANG MING·Filed 2009·Granted Jan 6, 2015·1 cites·17 claims
- 2755US2024102830A1Barrier layers for anisotropic magneto-resistive sensorsTEXAS INSTRUMENTS INC·Filed 2022·Application pending·0 cites
- 2852US9059174B2Method to reduce metal fuse thickness without extra maskDING HAI·Filed 2008·Granted Jun 16, 2015·1 cites·6 claims
- 2952US6586320B2Graded/stepped silicide process to improve mos transistorST MICROELECTRONICS INC·Filed 2001·Granted Jul 1, 2003·5 cites·5 claims
- 3052US2024332369A1Field plates for integrated circuitsTEXAS INSTRUMENTS INC·Filed 2023·Application pending·0 cites
- 3152US2008206919A1Method of manufacture of a microlens structure for opto-electric semiconductor deviceST MICROELECTRONICS INC·Filed 2008·Application pending·0 cites
- 3250US2024213333A1Iii-n device with planarized topological structureTEXAS INSTRUMENTS INC·Filed 2022·Application pending·0 cites
- 3346US10230273B2Electricity transmission sending method and device, and systemHUAWEI TECH CO LTD·Filed 2014·Granted Mar 12, 2019·0 cites·8 claims
- 3444US2023134596A1Metal stack to improve stack thermal stabilityTEXAS INSTRUMENTS INC·Filed 2021·Application pending·0 cites
- 3543US10276787B2Integrated anisotropic magnetoresistive deviceTEXAS INSTRUMENTS INC·Filed 2016·Granted Apr 30, 2019·0 cites·16 claims
- 3643US2006071149A1Microlens structure for opto-electric semiconductor device, and method of manufactureST MICROELECTRONICS INC·Filed 2004·Application pending·0 cites
- 3740US10068769B2Methods and apparatus for preventing counter-doping during high temperature processingTEXAS INSTRUMENTS INC·Filed 2016·Granted Sep 4, 2018·0 cites·20 claims
- 3838US7465660B2Graded/stepped silicide process to improve MOS transistorST MICROELECTRONICS INC·Filed 2003·Granted Dec 16, 2008·0 cites·8 claims
- 3937US2004070407A1Fingerprint detector with improved sensing surface layerFiled 2002·Application pending·0 cites
- 4036US2016107533A1Mains Supply Method and ApparatusHUAWEI TECH CO LTD·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →