Inventor · disambiguated record
Takahiro Kawasaki
Also filed as: KAWASAKI TAKAHIRO
11 granted patents·8 pending applications·30 citations·filing 1986–2025
85Inventor score
Files withMITSUBISHI ELECTRIC CORP6HITACHI HIGH TECH CORP5NGK INSULATORS LTD2NISHIHARA TAKASHI2KAWADA HIROKI1
Top patents by PatentIndex Score
19 records- 0176US9136567B2Chuck mechanism of charge-discharge test device for thin secondary batteryNISHIHARA TAKASHI·Filed 2011·Granted Sep 15, 2015·2 cites·5 claims
- 0275US9702695B2Image processing device, charged particle beam device, charged particle beam device adjustment sample, and manufacturing method thereofKAWADA HIROKI·Filed 2011·Granted Jul 11, 2017·5 cites·7 claims
- 0367US8742375B2Scanning electron microscope device, evaluation point generating method, and programKAWASAKI TAKAHIRO·Filed 2010·Granted Jun 3, 2014·3 cites·9 claims
- 0467US2022389577A1Manufacturing method for solar cell, solar cell, and solar cell manufacturing apparatusMITSUBISHI ELECTRIC CORP·Filed 2022·Application pending·0 cites
- 0565US8618804B2Chuck mechanism of charge/discharge testing device for flat-rechargeable batteriesNISHIHARA TAKASHI·Filed 2011·Granted Dec 31, 2013·1 cites·7 claims
- 0660US2025306474A1Semiconductor Pattern Evaluation Method, Semiconductor Manufacturing Process Management System, and Semiconductor Pattern Evaluation SystemHITACHI HIGH TECH CORP·Filed 2025·Application pending·0 cites
- 0759US2023094023A1Charged particle beam image processing device and charged particle beam apparatus including the sameHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 0858US2025324912A1Joined body and method for manufacturing joined bodyNGK INSULATORS LTD·Filed 2025·Application pending·0 cites
- 0956US11447869B2Manufacturing method for solar cell, solar cell, and solar cell manufacturing apparatusMITSUBISHI ELECTRIC CORP·Filed 2016·Granted Sep 20, 2022·0 cites·11 claims
- 1050US9514528B2Image processing apparatus, distortion-corrected map creation apparatus, and semiconductor measurement apparatusHITACHI HIGH TECH CORP·Filed 2012·Granted Dec 6, 2016·0 cites·9 claims
- 1147US11713963B2Pattern shape evaluation device, pattern shape evaluation system, and pattern shape evaluation methodHITACHI HIGH TECH CORP·Filed 2019·Granted Aug 1, 2023·0 cites·16 claims
- 1247US10665424B2Pattern measuring method and pattern measuring apparatusHITACHI HIGH TECH CORP·Filed 2018·Granted May 26, 2020·0 cites·8 claims
- 1347US9537026B2Method for manufacturing solar-power-generator substrate and apparatus for manufacturing solar-power-generator substrateMITSUBISHI ELECTRIC CORP·Filed 2014·Granted Jan 3, 2017·0 cites·12 claims
- 1447US2023074173A1Bonded body and a method of producing the sameNGK INSULATORS LTD·Filed 2022·Application pending·0 cites
- 1546US6046488ASemiconductor device having conductive layer and manufacturing method thereofMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Apr 4, 2000·13 cites·4 claims
- 1645US2021239406A1Heat exchange element and heat exchange ventilation apparatusMITSUBISHI ELECTRIC CORP·Filed 2018·Application pending·0 cites
- 1741US4726855AMethod of annealing a coreTOSHIBA KK·Filed 1986·Granted Feb 23, 1988·6 cites·6 claims
- 1835US2021063035A1Heat exchange element, heat exchange ventilator, and method for manufacturing heat exchange elementMITSUBISHI ELECTRIC CORP·Filed 2018·Application pending·0 cites
- 1929US2018292010A1Seal RingKK RIKEN·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →