Inventor · disambiguated record
Lien-Sheng Yang
Also filed as: YANG LIEN-SHENG
7 granted patents·1 pending application·19 citations·filing 2008–2020
76Inventor score
Files withETRON TECHNOLOGY INC2INTEGRATED SILICON SOLUTION INC2CHANG MIN-CHIH1CHEN WEI-JU1INTEGRATED CIRCUIT SOLUTION INC1
Top patents by PatentIndex Score
8 records- 0174US7965577B2Word line defect detecting device and method thereofETRON TECHNOLOGY INC·Filed 2009·Granted Jun 21, 2011·11 cites·6 claims
- 0264US7623388B2Method for detecting erroneous word lines of a memory array and device thereofETRON TECHNOLOGY INC·Filed 2008·Granted Nov 24, 2009·7 cites·12 claims
- 0351US9153344B1Device for detecting defective global word lineINTEGRATED CIRCUIT SOLUTION INC·Filed 2014·Granted Oct 6, 2015·1 cites·6 claims
- 0437US11378620B2Method and system for detecting abnormal dieINTEGRATED SILICON SOLUTION INC·Filed 2020·Granted Jul 5, 2022·0 cites·8 claims
- 0536US11195592B2Memory inspecting method and memory inspecting systemINTEGRATED SILICON SOLUTION INC·Filed 2020·Granted Dec 7, 2021·0 cites·5 claims
- 0631US8543877B2Method of performing a chip burn-in scanning with increased efficiencyCHEN WEI-JU·Filed 2011·Granted Sep 24, 2013·0 cites·11 claims
- 0731US2012254470A1Connector applied to a portable device and method of connecting a portable device with an external deviceKUO MING-HONG·Filed 2012·Application pending·0 cites
- 0821US8773931B2Method of detecting connection defects of memory and memory capable of detecting connection defects thereofCHANG MIN-CHIH·Filed 2012·Granted Jul 8, 2014·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →