Inventor · disambiguated record
Siming Lin
Also filed as: LIN SIMING
7 granted patents·2 pending applications·469 citations·filing 1999–2008
90Inventor score
Top patents by PatentIndex Score
9 records- 0193US7508504B2Automatic wafer edge inspection and review systemACCRETECH USA INC·Filed 2007·Granted Mar 24, 2009·44 cites·25 claims
- 0291US6944331B2Locating regions in a target image using color matching, luminance pattern matching and hue plane pattern matchingNAT INSTR CORP·Filed 2001·Granted Sep 13, 2005·66 cites·58 claims
- 0390US6963425B1System and method for locating color and pattern match regions in a target imageNAT INSTR CORP·Filed 2000·Granted Nov 8, 2005·97 cites·51 claims
- 0486US7039229B2Locating regions in a target image using color match, luminance pattern match and hill-climbing techniquesNAT INSTR CORP·Filed 2001·Granted May 2, 2006·73 cites·63 claims
- 0586US6757428B1System and method for color characterization with applications in color measurement and color matchingNAT INSTR CORP·Filed 1999·Granted Jun 29, 2004·101 cites·46 claims
- 0683US7668376B2Shape feature extraction and classificationNAT INSTR CORP·Filed 2004·Granted Feb 23, 2010·59 cites·50 claims
- 0780US7046842B2System and method for color characterization using fuzzy pixel classification with application in color matching and color match locationNAT INSTR CORP·Filed 2000·Granted May 16, 2006·29 cites·33 claims
- 0847US2009122304A1Apparatus and Method for Wafer Edge Exclusion MeasurementACCRETECH USA INC·Filed 2008·Application pending·0 cites
- 0947US2009116727A1Apparatus and Method for Wafer Edge Defects DetectionACCRETECH USA INC·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →