Inventor · disambiguated record
Tab A. Stephens
Also filed as: STEPHENS TAB A · STEPHENS TAB ALLEN
38 granted patents·1 pending application·762 citations·filing 2003–2015
98Inventor score
Files withFREESCALE SEMICONDUCTOR INC30MCSHANE MICHAEL B3PELLEY PERRY H2ADVANCED MICRO DEVICES INC1MATHEW LEO1
Top patents by PatentIndex Score
39 records- 0199US7504302B2Process of forming a non-volatile memory cell including a capacitor structureFREESCALE SEMICONDUCTOR INC·Filed 2005·Granted Mar 17, 2009·241 cites·20 claims
- 0298US7015517B2Semiconductor device incorporating a defect controlled strained channel structure and method of making the sameFREESCALE SEMICONDUCTOR INC·Filed 2005·Granted Mar 21, 2006·92 cites·10 claims
- 0395US7339241B2FinFET structure with contactsFREESCALE SEMICONDUCTOR INC·Filed 2005·Granted Mar 4, 2008·42 cites·11 claims
- 0495US6919258B2Semiconductor device incorporating a defect controlled strained channel structure and method of making the sameFREESCALE SEMICONDUCTOR INC·Filed 2003·Granted Jul 19, 2005·104 cites·10 claims
- 0594US9094135B2Die stack with optical TSVsFREESCALE SEMICONDUCTOR INC·Filed 2013·Granted Jul 28, 2015·19 cites·20 claims
- 0694US6831350B1Semiconductor structure with different lattice constant materials and method for forming the sameFREESCALE SEMICONDUCTOR INC·Filed 2003·Granted Dec 14, 2004·89 cites·21 claims
- 0792US9435952B2Integration of a MEMS beam with optical waveguide and deflection in two dimensionsFREESCALE SEMICONDUCTOR INC·Filed 2013·Granted Sep 6, 2016·14 cites·15 claims
- 0892US7091071B2Semiconductor fabrication process including recessed source/drain regions in an SOI waferFREESCALE SEMICONDUCTOR INC·Filed 2005·Granted Aug 15, 2006·22 cites·20 claims
- 0987US9810843B2Optical backplane mirrorFREESCALE SEMICONDUCTOR INC·Filed 2013·Granted Nov 7, 2017·8 cites·21 claims
- 1087US9261556B2Optical wafer and die probe testingFREESCALE SEMICONDUCTOR INC·Filed 2013·Granted Feb 16, 2016·7 cites·19 claims
- 1187US9091820B2Communication system die stackFREESCALE SEMICONDUCTOR INC·Filed 2013·Granted Jul 28, 2015·8 cites·20 claims
- 1284US7491630B2Undoped gate poly integration for improved gate patterning and cobalt silicide extendibilityFREESCALE SEMICONDUCTOR INC·Filed 2006·Granted Feb 17, 2009·11 cites·20 claims
- 1383US7910482B2Method of forming a finFET and structureFREESCALE SEMICONDUCTOR INC·Filed 2008·Granted Mar 22, 2011·11 cites·20 claims
- 1477US6951783B2Confined spacers for double gate transistor semiconductor fabrication processFREESCALE SEMICONDUCTOR INC·Filed 2003·Granted Oct 4, 2005·23 cites·19 claims
- 1576US9070653B2Microelectronic assembly having a heat spreader for a plurality of dieFREESCALE SEMICONDUCTOR INC·Filed 2013·Granted Jun 30, 2015·3 cites·20 claims
- 1675US7659156B2Method to selectively modulate gate work function through selective Ge condensation and high-K dielectric layerFREESCALE SEMICONDUCTOR INC·Filed 2007·Granted Feb 9, 2010·5 cites·19 claims
- 1774US8980734B2Gate security featureFREESCALE SEMICONDUCTOR INC·Filed 2013·Granted Mar 17, 2015·3 cites·14 claims
- 1872US8796855B2Semiconductor devices with nonconductive viasPELLEY PERRY H·Filed 2012·Granted Aug 5, 2014·3 cites·17 claims
- 1972US8680674B2Methods and structures for reducing heat exposure of thermally sensitive semiconductor devicesMCSHANE MICHAEL B·Filed 2012·Granted Mar 25, 2014·3 cites·20 claims
- 2071US9766409B2Optical redundancyFREESCALE SEMICONDUCTOR INC·Filed 2013·Granted Sep 19, 2017·2 cites·16 claims
- 2171US8258035B2Method to improve source/drain parasitics in vertical devicesMATHEW LEO·Filed 2007·Granted Sep 4, 2012·4 cites·18 claims
- 2268US6972255B2Semiconductor device having an organic anti-reflective coating (ARC) and method thereforADVANCED MICRO DEVICES INC·Filed 2003·Granted Dec 6, 2005·10 cites·14 claims
- 2367US9099475B2Techniques for reducing inductance in through-die vias of an electronic assemblyMCSHANE MICHAEL B·Filed 2012·Granted Aug 4, 2015·2 cites·19 claims
- 2467US9082757B2Stacked semiconductor devicesPELLEY PERRY H·Filed 2013·Granted Jul 14, 2015·2 cites·13 claims
- 2563US7829447B2Semiconductor structure pattern formationFREESCALE SEMICONDUCTOR INC·Filed 2006·Granted Nov 9, 2010·7 cites·21 claims
- 2663US7235471B2Method for forming a semiconductor device having a silicide layerFREESCALE SEMICONDUCTOR INC·Filed 2004·Granted Jun 26, 2007·8 cites·19 claims
- 2762US9318451B2Wirebond recess for stacked diePHAM TIM V·Filed 2013·Granted Apr 19, 2016·2 cites·19 claims
- 2861US9093429B2Methods and structures for reducing heat exposure of thermally sensitive semiconductor devicesMCSHANE MICHAEL B·Filed 2012·Granted Jul 28, 2015·1 cites·17 claims
- 2959US7911002B2Semiconductor device with selectively modulated gate work functionFREESCALE SEMICONDUCTOR INC·Filed 2009·Granted Mar 22, 2011·1 cites·19 claims
- 3059US7208424B2Method of forming a semiconductor device having a metal layerFREESCALE SEMICONDUCTOR INC·Filed 2004·Granted Apr 24, 2007·6 cites·13 claims
- 3156US7566623B2Electronic device including a semiconductor fin having a plurality of gate electrodes and a process for forming the electronic deviceFREESCALE SEMICONDUCTOR INC·Filed 2007·Granted Jul 28, 2009·1 cites·20 claims
- 3254US7074713B2Plasma enhanced nitride layerFREESCALE SEMICONDUCTOR INC·Filed 2004·Granted Jul 11, 2006·6 cites·26 claims
- 3352US8039389B2Semiconductor device having an organic anti-reflective coating (ARC) and method thereforFREESCALE SEMICONDUCTOR INC·Filed 2007·Granted Oct 18, 2011·0 cites·2 claims
- 3449US7199429B2Semiconductor device having an organic anti-reflective coating (ARC) and method thereforFREESCALE SEMICONDUCTOR INC·Filed 2005·Granted Apr 3, 2007·0 cites·6 claims
- 3547US9431380B2Microelectronic assembly having a heat spreader for a plurality of dieFREESCALE SEMICONDUCTOR INC·Filed 2015·Granted Aug 30, 2016·0 cites·17 claims
- 3645US10230458B2Optical die test interface with separate voltages for adjacent electrodesFREESCALE SEMICONDUCTOR INC·Filed 2013·Granted Mar 12, 2019·0 cites·20 claims
- 3745US7745298B2Method of forming a viaFREESCALE SEMICONDUCTOR INC·Filed 2007·Granted Jun 29, 2010·0 cites·4 claims
- 3843US7132327B2Decoupled complementary mask patterning transfer methodFREESCALE SEMICONDUCTOR INC·Filed 2004·Granted Nov 7, 2006·2 cites·18 claims
- 3942US2007196988A1Poly pre-doping anneals for improved gate profilesSHROFF MEHUL D·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →