Inventor · disambiguated record
Heui-Jae Park
Also filed as: PARK HEUI JAE
2 granted patents·3 pending applications·37 citations·filing 1996–2009
63Inventor score
Top patents by PatentIndex Score
5 records- 0180US8223326B2Dark-field examination deviceKIM TAI-WOOK·Filed 2009·Granted Jul 17, 2012·17 cites·5 claims
- 0258US2011013015A1Vision inspection system and inspection method using the sameSNU PRECISION CO LTD·Filed 2009·Application pending·0 cites
- 0352US5726746AAutomatic inspection system for camera lenses and method thereof using a line charge coupled deviceSAMSUNG AEROSPACE IND·Filed 1996·Granted Mar 10, 1998·20 cites·17 claims
- 0441US2010029019A1Detecting materials on wafer and repair system and method thereofSNU PRECISION CO LTD·Filed 2009·Application pending·0 cites
- 0539US2011279670A1Apparatus for Measuring Three-Dimensional Profile Using LCDPARK HEUI-JAE·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →