Inventor · disambiguated record
Gi-Young Yang
Also filed as: YANG GI-YOUNG
22 granted patents·49 citations·filing 2002–2024
92Inventor score
Top patents by PatentIndex Score
22 records- 0196US9460259B2Methods of generating integrated circuit layout using standard cell librarySAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Oct 4, 2016·23 cites·11 claims
- 0283US12464821B2Integrated circuit including integrated standard cell structureSAMSUNG ELECTRONICS CO LTD·Filed 2024·Granted Nov 4, 2025·0 cites·12 claims
- 0383US10354947B2Integrated circuit including standard cellSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Jul 16, 2019·3 cites·7 claims
- 0482US11244961B2Integrated circuit including integrated standard cell structureSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Feb 8, 2022·1 cites·20 claims
- 0576US9842182B2Method and system for designing semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Dec 12, 2017·3 cites·18 claims
- 0675US11973081B2Integrated circuit including integrated standard cell structureSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Apr 30, 2024·0 cites·12 claims
- 0775US9087566B2Semiconductor memory devices including a discharge circuitSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Jul 21, 2015·5 cites·20 claims
- 0872US9576953B2Layout design system, semiconductor device fabricated by using the system and method for fabricating the semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Feb 21, 2017·3 cites·16 claims
- 0968US8108159B2Method of detecting degradation of semiconductor devices and method of detecting degradation of integrated circuitsYANG GI-YOUNG·Filed 2008·Granted Jan 31, 2012·3 cites·23 claims
- 1066US11239151B2Integrated circuit including standard cellSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Feb 1, 2022·0 cites·14 claims
- 1163US8281268B2Method and system detecting metal line failureYANG GI-YOUNG·Filed 2009·Granted Oct 2, 2012·3 cites·14 claims
- 1262US10371389B2Cooking deviceSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Aug 6, 2019·1 cites·16 claims
- 1361US10672702B2Integrated circuit including standard cellSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Jun 2, 2020·0 cites·14 claims
- 1460US9324384B2Sense amplifiers and memory devices having the sameSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Apr 26, 2016·2 cites·16 claims
- 1558US7933753B2Modeling circuit of a field-effect transistor reflecting electrostatic-discharge characteristicSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Apr 26, 2011·1 cites·29 claims
- 1654US12396257B2Integrated circuit including integrated standard cell structureSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Aug 19, 2025·0 cites·14 claims
- 1750US7246051B2Method for extrapolating model parameters of spiceSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Jul 17, 2007·1 cites·19 claims
- 1848US10108772B2Methods of generating integrated circuit layout using standard cell librarySAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Oct 23, 2018·0 cites·9 claims
- 1943US11735592B2Integrated circuit including integrated standard cell structureSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Aug 22, 2023·0 cites·9 claims
- 2043US9852252B2Standard cell library and methods of using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Dec 26, 2017·0 cites·19 claims
- 2139US8664724B2Semiconductor devices having slit well tubKIM SE-YOUNG·Filed 2011·Granted Mar 4, 2014·0 cites·20 claims
- 2233US7298160B2Method of measuring gate capacitance by correcting dissipation factor errorSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Nov 20, 2007·0 cites·12 claims
Join the waitlist — get patent alerts
Get an alert when Gi-Young Yang files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →