Inventor · disambiguated record
Hideo Kashima
Also filed as: KASHIMA HIDEO
36 granted patents·1 pending application·1,090 citations·filing 1997–2019
98Inventor score
Top patents by PatentIndex Score
37 records- 0199US6664552B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2001·Granted Dec 16, 2003·139 cites·2 claims
- 0298US6077027ASemiconductor manufacturing apparatus for transferring articles with a bearing-less joint and method for manufacturing semiconductor deviceHITACHI LTD·Filed 1999·Granted Jun 20, 2000·418 cites·17 claims
- 0397US6781125B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2001·Granted Aug 24, 2004·114 cites·14 claims
- 0496US7205560B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2005·Granted Apr 17, 2007·32 cites·27 claims
- 0596US7205554B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2005·Granted Apr 17, 2007·34 cites·5 claims
- 0695US7550750B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2007·Granted Jun 23, 2009·26 cites·32 claims
- 0795US6927391B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2004·Granted Aug 9, 2005·69 cites·4 claims
- 0894US7897936B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2007·Granted Mar 1, 2011·15 cites·15 claims
- 0994US7470918B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2007·Granted Dec 30, 2008·22 cites·15 claims
- 1094US7465945B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2007·Granted Dec 16, 2008·20 cites·7 claims
- 1192US8840496B2Cooling air intake structure for V-belt drive continuously variable transmissionYAMANISHI TERUHIDE·Filed 2009·Granted Sep 23, 2014·28 cites·9 claims
- 1292US7888639B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2007·Granted Feb 15, 2011·14 cites·2 claims
- 1392US6794663B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2003·Granted Sep 21, 2004·33 cites·9 claims
- 1490US7268356B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2004·Granted Sep 11, 2007·28 cites·13 claims
- 1589US8222618B2Method and apparatus for processing a microsampleTOKUDA MITSUO·Filed 2011·Granted Jul 17, 2012·9 cites·18 claims
- 1688US8618520B2Method and apparatus for processing a micro sampleTOKUDA MITSUO·Filed 2012·Granted Dec 31, 2013·7 cites·24 claims
- 1784US9040905B2Analysis device and analysis methodNAGANO HISASHI·Filed 2011·Granted May 26, 2015·5 cites·20 claims
- 1883US9261437B2Attached matter inspection deviceHITACHI LTD·Filed 2013·Granted Feb 16, 2016·4 cites·12 claims
- 1983US9214324B2Analysis device and analysis methodHITACHI LTD·Filed 2015·Granted Dec 15, 2015·3 cites·4 claims
- 2083US6884997B2Method and apparatus for detecting dangerous substances and substances of interestHITACHI LTD·Filed 2003·Granted Apr 26, 2005·27 cites·28 claims
- 2181US9287084B2Aberration corrector and charged particle beam apparatus using the sameHITACHI HIGH TECH CORP·Filed 2015·Granted Mar 15, 2016·3 cites·15 claims
- 2279US9696288B2Attached matter testing device and testing methodHITACHI LTD·Filed 2012·Granted Jul 4, 2017·3 cites·11 claims
- 2377US8796651B2Method and apparatus for specimen fabricationSHICHI HIROYASU·Filed 2011·Granted Aug 5, 2014·2 cites·12 claims
- 2477US8217339B2Adhering matter inspection equipment and method for inspecting adhering methodKASHIMA HIDEO·Filed 2005·Granted Jul 10, 2012·5 cites·12 claims
- 2576US9417163B2Analyzer for substanceHITACHI LTD·Filed 2014·Granted Aug 16, 2016·2 cites·8 claims
- 2668US9423388B2Particle analyzing deviceHITACHI LTD·Filed 2013·Granted Aug 23, 2016·1 cites·15 claims
- 2767US9850696B2Microparticle detection device and security gateHITACHI LTD·Filed 2013·Granted Dec 26, 2017·4 cites·16 claims
- 2867US7164124B2Mass spectrometric apparatus and ion sourceHITACHI LTD·Filed 2004·Granted Jan 16, 2007·6 cites·20 claims
- 2965US9773640B2Sample holder, charged particle beam apparatus, and observation methodHITACHI LTD·Filed 2015·Granted Sep 26, 2017·1 cites·10 claims
- 3065US8963102B2Charged particle beam microscope, sample holder for charged particle beam microscope, and charged particle beam microscopyHITACHI HIGH TECH CORP·Filed 2013·Granted Feb 24, 2015·1 cites·15 claims
- 3155US11769650B2Multistage-connected multipole, multistage multipole unit, and charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Sep 26, 2023·0 cites·20 claims
- 3254US8586916B2Adhering matter inspection equipment and method for inspecting adhering matterKASHIMA HIDEO·Filed 2011·Granted Nov 19, 2013·0 cites·4 claims
- 3353US10048172B2Substance-testing apparatus, substance-testing system, and substance-testing methodHITACHI LTD·Filed 2014·Granted Aug 14, 2018·0 cites·14 claims
- 3453US5971701ASemiconductor manufacturing apparatus for transferring articles with a bearing-less joint and method for manufacturing semiconductor deviceHITACHI LTD·Filed 1997·Granted Oct 26, 1999·15 cites·7 claims
- 3549US10945684B2Ultrasonic CT deviceHITACHI LTD·Filed 2019·Granted Mar 16, 2021·0 cites·13 claims
- 3646US12354826B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2019·Granted Jul 8, 2025·0 cites·8 claims
- 3739US2006070936A1Mineral water feeding apparatusKATO ISAO·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →